Daikin Industries, Ltd.

Atsushi Sakakura

Masao Noumi

Tsuneo Yamashita

Yoshiki Shimizu

Masamichi Morita

Hiroki Yamaguchi

Eiji Sakamoto

Akira Chida

Saya Nii

Kazuki Hosoda

Hideya Saitoh

Masayuki Oka

An optical coherence tomography device, and an optical coherence tomography method using the optical coherence tomography device. The optical coherence tomography device includes an objective lens configured to focus light from a light source onto a sample and is configured to perform tomographic imaging of the sample based on interference between sample light, which is reflected light from the sample, and reference light, which is reflected light from a reference surface provided between the objective lens and the sample. The sample light and the reference light are each to pass through the objective lens. The objective lens is an Fθ lens.

Optical coherence tomography device and optical coherence tomography method

An object of the present disclosure is to provide a film that has high water slidability, and a substrate having a surface covered with the film. The present disclosure provides a film having the properties of a sliding velocity of 150 mm/s or more at an inclination angle of 30° and an average surface roughness (Ra) of 1 μm or less, and further provides a substrate having a surface covered with the film.

Film and substrate having surface covered with same

A method for inspecting a joint portion between fluororesin members, including: a step (A1) of inspecting an internal condition of a joint portion between a fluororesin member (A1) and a fluororesin member (A2) based on image data obtained by imaging the joint portion by optical coherence tomography. Also disclosed is a method for inspecting a fluororesin member, including: a step (B1) of inspecting a defect inside a fluororesin member (B1) based on image data obtained by imaging the fluororesin member (B1) by optical coherence tomography.

Method of inspecting joint portion of fluororesin member and fluororesin member inspection method

A functional film includes layer (A) containing a resin and layer (B) containing a compound containing a perfluoropolyether group. Layer (B) has a microrelief pattern structure on a surface remote from layer (A). In elemental analysis by X-ray photoelectron spectroscopy from the layer (B) side, the functional film satisfies formula (1): D1&#x3c;2&#xd7;X1, wherein X1 is a thickness (nm) of layer (B); and D1 is a depth (nm) at which fluorine atoms exhibit a concentration of 1 atom % or lower. In carbon 1s spectrum measurement by X-ray photoelectron spectroscopy from the layer (B) side, the functional film satisfies formula (2): D2&#x3c;2&#xd7;X1, wherein X1 is the thickness (nm) of layer (B); and D2 is a depth (nm) at which no peak is detected within a bond energy range of 290 to 300 eV.

Functional film

A vinylidene fluoride copolymer comprising 50 to 90% by mole of units having the formula (I):

Growing community of inventors

Osaka, Japan

Atsushi Sakakura