Hitachi, Ltd.

Hitachi-high-technologies Corporation

Atsushi Ohtake

Kinya Kobayashi

Kiyomi Yoshinari

Toshiyuki Yokosuka

Atsumu Hirabayashi

Akihiro Sano

A resin material of high strength and high voltage equipment capable of improving the reliability by using the resin material, the resin material being a hardened product including fine particles and resin ingredients, in which the fine particles have hydrophobic groups on the surface and have a particle diameter of 200 nm or less, the resin ingredients have hydrophilic groups on the side chains, and the fine particles form a plurality of linear aggregates inside the resin, thereby forming a dendritic structure.

Resin material and high voltage equipment using the resin material

A tandem analysis system is provided for ionizing a substance, performing mass spectrometric analysis of various ion types generated, selecting and dissociating an ion type, the ion type having a specific mass-to-charge ratio, and thereby, repeating mass spectrometric analysis measurement on the ion of the ion type over n-th stages. A processing judges control content for the analysis next to MS(the n-th stage mass spectrometric analysis) within a predetermined time, based on ion intensity being represented by an ion peak with respect to the mass-to-charge ratio of each ion in the MSresult. An ion detection unit judges isotope-peak from the measured ionized data. Assuming that the MScount number of a parent-ion peptide measured during a certain constant time-interval is I, a data processing unit makes the MSintegration number-of-times or analysis time of the peptide proportional to 1/I.

Mass spectrometric analysis method and system using the method

In a method of measuring by a tandem mass spectrometer a sample labeled with an isotope, measuring throughput is improved. In a technique in which tandem mass spectrometer is used to analyze a sample labeled with an isotope, spectra obtained by a first-stage measurement (MS) are analyzed during a measuring session in a realtime fashion to determine ions to be used in second-stage and subsequent dissociation&#x2022; spectral measurement (MS2).

Mass spectrometry and mass spectrometry system

This invention provides an inspection method and device which can efficiently measure the surface uniformity of a semiconductor device which is chemically and mechanically polished based on measured data at several points on the surface of the chip.

Growing community of inventors

Hitachiota, Japan

Atsushi Ohtake