Rigaku Corporation

Atsushi Ohbuchi

Takayuki Konya

Akihiro Himeda

Tetsuya Ozawa

Go Fujinawa

Ichiro Tobita

Miki Kasari

Sigematsu Asano

Takahiro Kuzumaki

A quantitative analysis apparatus, a method, a program, and a manufacturing control system are provided. A WPPF sectionfor determining parameters of theoretical diffraction intensity by performing whole powder pattern fitting with respect to an X-ray diffraction profile to be analyzed, a scale factor acquiring sectionfor acquiring a scale factor of a test component among the determined parameters, a calibration curve storing sectionfor storing a calibration curve indicating a correlation between scale factors of the test component acquired with respect to a standard sample and content ratios of the test component in the standard sample, and a conversion sectionfor converting the scale factor of the test component acquired with respect to an objective sample into the content ratio of the test component in the objective sample using the stored calibration curve, are comprised.

Quantitative analysis apparatus, method and program and manufacturing control system

An analysis apparatus, an analysis method, and an analysis program by which even unskilled ones can perform quantitative analysis of a composition of high-performance cement with high precision. An analysis apparatusfor performing quantitative analysis of components of cement, includes: a content percentage conversion unitfor converting content percentages of major elements of a cement sample to content ratios of main crystal phases composing the cement sample by predetermined formulae, the content percentages being obtained as an elemental analysis result; a scale factor estimation unitfor estimating initial values of scale factors of Rietveld analysis from the content ratios of main crystal phases obtained in the conversion; and a Rietveld analysis unitfor performing Rietveld analysis with respect to an X-ray diffraction measurement result of the cement sample using the initial values of scale factors previously been estimated to calculate content percentages of respective phases of the cement sample.

Analysis apparatus, analysis method and analysis program

An X-ray shielding member is provided so as to confront an X-ray incident face of a sample, and a gap through which an X-ray emitted from an X-ray source is passed and irradiated to an X-ray incident face of the sample is formed between the X-ray shielding member and the X-ray incident face of the sample. A gap adjusting mechanism for moving the X-ray shielding member is further provided to move the X-ray shielding member in accordance with change of an X-ray incident angle to the sample by a goniometer, whereby the breadth of the gap formed between the X-ray shielding member and the X-ray incident face of the sample can be adjusted.

X-ray diffraction apparatus

Growing community of inventors

Tokyo, Japan

Atsushi Ohbuchi