Rigaku Corporation

Atsushi Morikawa

Yoshiyuki Kataoka

Yasujiro Yamada

Kenji Watanabe

An X-ray fluorescence analyzing method includes irradiating a liquid sample (A) containing hydrogen and at least one element of carbon, oxygen and nitrogen with primary X-rays (); measuring the intensity F of fluorescent X-rays () from each of elements in the sample (A) and having the atomic number 9 to 20, and the intensity S of scattered X-rays () from the sample (A) caused by continuous X-rays in the primary X-rays; and calculating the concentration of each of the elements, based on the ratio between the measured intensity F, and the measured intensity S. The wavelength of the scattered X-rays () is so chosen as to be shorter than that of the fluorescent X-rays () and is so set that the measured intensity S and the mass absorption coefficient thereof are inversely proportional to each other within the range of variation of a composition of the sample (A).

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Takatsuki, Japan

Atsushi Morikawa