Agc Inc.

Asahi Glass Company, Limited

Mitsubishi Electric Corporation

Atsushi Komori

Makoto Hasegawa

Hitoshi Tsuchiya

Yoshiharu Ooi

Hiroshi Shimoda

Hiroki Hotaka

Kazuhiko Shiono

Yukihiro Tao

Hiroyuki Arishima

Teppei Konishi

Yoko Mitsui

Yasushi Kawamoto

Takashi Sugiyama

Katsumasa Hosoi

Aya Ikoma

An image projection structure includes a first transparent layer having an irregular surface; a reflection layer arranged on the irregular surface of the first transparent layer; an adhesion layer arranged on the reflection surface; and a second transparent layer arranged on the adhesion layer. The adhesion layer is configured of linear polymers with a mold shrinkage factor of less than 3%. The second transparent layer is configured of a resin having a cross-linking structure.

Image projection structure, transparent screen, and manufacturing method of image projection structure

There are provided a near-infrared cut filter having a sufficient near-infrared blocking property and being capable of reducing or preventing, in a solid-state imaging device using the near-infrared cut filter, occurrence of a phenomenon that an object which did not exist on the original subject appears in a taken image, and also a highly sensitive solid-state imaging device having the near-infrared cut filter. A near-infrared cut filter includes a stack having a near-infrared absorbing glass substrate and a near-infrared absorbing layer containing a near-infrared absorbing dye and a transparent resin on at least one main surface of the near-infrared absorbing glass substrate, and a dielectric multilayer film formed on at least one main surface of the stack, wherein maximum transmittance at an incident angle of 31 to 60 degrees with respect to light with a wavelength of from 775 to 900 nm is 50% or less.

Near-infrared cut filter and solid-state imaging device

There are provided a near-infrared cut filter that effectively uses near-infrared absorbing glass and a near-infrared absorbing dye and is excellent in a near-infrared shielding property, and a high-sensitivity solid-state imaging device including the same. A near-infrared cut filter includes: a near-infrared absorbing glass substrate made of CuO-containing fluorophosphate glass or CuO-containing phosphate glass; and a near-infrared absorbing layer containing a near-infrared absorbing dye (A) and a transparent resin (B), on at least one principal surface of the near-infrared absorbing glass substrate, wherein an average value of a transmittance in a 400 nm to 550 nm wavelength range is 80% or more, and an average value of a transmittance in a 650 nm to 720 nm wavelength range is 15% or less.

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Koriyama, Japan

Atsushi Komori