Hamamatsu-photonics K.k.

Atsushi Ihori

Yukinobu Sugiyama

Keisuke Nakao

The solid-state imaging deviceincludes an imaging photodetecting section, a trigger photodetecting section, a row selection section, a column selection section, a holding section, a pixel data output section, a trigger data output section, and a control section. In a shutter method of the solid-state imaging device, the start of a charge accumulation period is common to all rows of the imaging photodetecting section, while the end of the charge accumulation period varies row by row of the imaging photodetecting section, and there is a signal readout period subsequent to the charge accumulation period in each row of the imaging photodetecting section. Accordingly, a solid-state imaging device that can perform high-accuracy imaging even when the incident period of light to be imaged is considerably short is realized.

Solid-state imaging device including an imaging photodetecting section with a two dimensional array of pixel units and an operation control section

The solid-state imaging deviceincludes an imaging photodetecting section, a trigger photodetecting section, a row selection section, a column selection section, a holding section, a pixel data output section, a trigger data output section, and a control section. The control section, when an absolute value of trigger data has changed into a state of being in excess of a first threshold, and then the state has continued for a predetermined time &#x3c4;or more, judges it as a start of a light incidence, and starts a charge accumulating operation for each pixel unit, and when an absolute value of trigger data has changed into a state of being less than a second threshold, and then the state has continued for a predetermined time &#x3c4;or more, judges it as an end of a light incidence, and causes a charge transferring operation and a data outputting operation to be performed for each pixel unit. Accordingly, a solid-state imaging device that can perform accurate imaging even for various applications and light incidence patterns is realized.

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Hamamatsu, Japan

Atsushi Ihori