Shimadzu Corporation

Atsuhiko Otaguro

Tomoki Sasayama

Ryuta Shibutani

Tomoyo Tao

Fumiya Katsutani

Hisato Fukuda

Osuke Kobayashi

An infrared Raman device is capable of switching and performing Raman measurement and first infrared measurement on a sample. The infrared Raman device includes an objective lens for Raman measurement; a first observation lens for infrared measurement; a laser light source that generates laser light; a first infrared light source that generates first infrared light; and a mirror. The mirror is disposed at time of the Raman measurement to reflect the laser light to cause the laser light to pass through the objective lens for Raman measurement and reflect Raman light generated from the sample by the laser light that passes through the objective lens for Raman measurement and radiated to the sample. The Raman light passes back through the objective lens for Raman measurement.

Infrared Raman device

A Raman infrared compound microscope device includes: a first light source that generates laser light; a second light source that generates infrared light; a third light source that generates visible light; and a first optical system. The first optical system orients the visible light having reached the first optical system in different directions between when performing a Raman analysis using Raman light generated from a sample by irradiation of the laser light and when performing a first infrared analysis using the infrared light having passed through the sample.

Raman infrared compound microscope device

An atomization unit has a tube-shaped furnace, and heats and atomizes a sample injected into the furnace. A light source unit emits light having a wavelength to be measured toward the atomization unit such that light passes through the furnace. An optical system transmits the light having the wavelength to be measured, of light passing through the furnace. A detection unit detects the light transmitted by the optical system. A light transmission plate is provided at a position in an optical path of the light passing through the furnace toward the detection unit, to obliquely cross an optical axis of the light. An image capturing unit is arranged outside the optical path, and captures an image inside the furnace by receiving light reflected by the light transmission plate, of the light passing through the furnace.

Growing community of inventors

Kyoto, Japan

Atsuhiko Otaguro