Rohde and Schwarz Gmbh & Co. Kg

Athanasios Karamalis

Sherif Sayed Ahmed

Benoit Derat

Frank Gumbmann

Andreas Schiessl

A method and a system for detecting faulty devices are provided. The method comprises the steps of gathering test data in near field with respect to a device under test, extrapolating the test data to far field conditions with the aid of at least one machine learning technique, and evaluating a far field performance of the device under test on the basis of the far field conditions.

Method and system for detecting faulty devices

A system for scanning a form of interest, while the form of interest is in motion, is provided. The system comprises a first detector panel-pair, comprising a first detector panel and a second detector panel, spatially offset from the first detector panel by a first continuous passageway for the motion of the form of interest. A second detector panel-pair comprises a third detector panel and a fourth detector panel, spatially offset from the third detector panel by a second continuous passageway for the motion of the form of interest, and a location-tracking device adapted to monitor the location of the form of interest.

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Munich, Germany

Athanasios Karamalis