Freescale Semiconductor,inc.

Ateet Mishra

Gaurav Goyal

Reecha Jajodia

Ashis Maitra

Deepak Mahajan

Shiva Belwal

Flip-flop cells that enable time borrowing during the design of the IC to improve setup times while avoiding introducing meta-stability, and alternatively to avoid hold time violations. The flip-flop cells are connected with logic cells in functional data paths. The flip-flop cell has a clock signal controlling both its input and output. A selective delay cell selectively delays either a data signal input to the flip-flop cell or the clock signal controlling the flip-flop cell. The selectively delayed signal adjusts the timing (setup, hold and clock-to-output) of the data path.

Flip-flop cell with configurable delay

An EDA tool for verifying timing constraints of an integrated circuit (IC) design includes a processor and a memory that stores register transfer level (RTL) code of the IC design and a timing constraint file. The processor generates a netlist based on the RTL code, and identifies asynchronous clock paths, false paths and multi-cycle paths in the netlist using the timing constraint file. The processor then inserts buffer cells for logic cells in the netlist. The processor also inserts buffer cells in the asynchronous clock paths, false paths, and multi-cycle paths. The processor delay annotates logic cells and clock delay cells with a zero delay value and the buffer cells with known delay values. The processor generates a modeled standard delay format (SDF) file and performs a gate level simulation (GLS) using the modeled SDF file.

System for verifying timing constraints of IC design

A scan flip-flop for generating an output signal based on a first input signal, a clock signal, a test input signal, a Launch On Shift (LOS) signal, a test enable signal, and a reset signal includes a logic circuit, a multiplexer and a flip-flop circuit. The logic circuit receives an inverted clock signal, the test enable signal, a intermediate test enable signal, and the LOS signal, and generates an intermediate output signal that is an inherent LOS scan enable signal. The multiplexer receives the test input signal and the intermediate output signal, and outputs the test input signal. The flip-flop circuit receives the test input signal as a second input signal, the clock signal, and the reset signal, and generates the output signal.

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Ateet Mishra