Nec Corporation

Astha Jada

Takayuki Sasaki

Adrian Perrig

Toshiki Kobayashi

Daniele Enrico Asoni

A semiconductor device () includes: a determination unit () configured to determine whether an avoidance condition of inspection of control flow integrity is satisfied (e.g., a degree of similarity with a previous input value is in a predetermined range) based on determination auxiliary information, which is at least an input value in a target code block to be executed among a plurality of code blocks in a predetermined program, and an inspection unit () configured to avoid inspection of control flow integrity in the target code block when it is determined that the avoidance condition is satisfied.

Semiconductor device, control flow inspection method, non-transitory computer readable medium, and electronic device

A semiconductor device () includes: first storage means () storing, in advance, a plurality of pieces of execution order inspection information () used for inspection of an execution order of a plurality of code blocks in a predetermined program, second storage means (), which is a cache for the first storage means, and prediction means () for predicting a storage area of the execution order inspection information based on prediction auxiliary information in a first code block of the plurality of code blocks and a control flow graph of the program, the storage area being a prefetch target to be prefetched from the first storage means to the second storage means.

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Tokyo, Japan

Astha Jada