Apple Inc.

Primesense Ltd

Assaf Avraham

Refael Della Pergola

Roei Remez

Yuval Tsur

Erez Sali

Boris Morgenstein

Gidi Lasovski

Paul Stephen Drzaic

Hoon Sik Kim

Moshe Kriman

Yazan Z Alnahhas

Gregory A Cohoon

Andrew T Herrington

Jonathan Hauser

Yohai Zmora

Dror Leshem

Shay Keren-Zur

Maoz Ovadia

David Pawlowski

Tom Levy

Ali M Khan

Shay Yosub

Yaron Gross

Omer Eden

Alex Pekin

Rafi Ambar

Roey Zuitlin

Sensing apparatus includes a projector, which projects toward a target a pattern of spots extending over a predefined angular range about a projection axis. An imaging assembly includes an image sensor and objective optics, which form on the image sensor an image of the target along an imaging axis, which is offset transversely relative to the projection axis. A processor is configured to process signals output by the image sensor so as generate, while the target is within a first span of distances from the apparatus, a depth map of the target responsively to shifts of the spots in the image, and to estimate, while the target is within a second span of distances, nearer to the apparatus than the first span, a distance to the target from the apparatus by detecting in the image a part of the pattern located at an edge of the angular range.

Proximity sensing using structured light

An optoelectronic apparatus includes an array of emitters configured to emit beams of optical radiation. An optical substrate is mounted over the array. An optical metasurface is disposed on the optical substrate and configured to collimate and split each of the emitted beams into a respective group of collimated sub-beams, and to direct the collimated sub-beams toward a target to form a pattern of spots on the target.

MOE-based illumination projector

An optoelectronic apparatus includes a semiconductor substrate and an array of emitters disposed on the semiconductor substrate and configured to emit beams of optical radiation having respective chief rays. An optical diffuser is mounted over the semiconductor substrate and configured to diffuse the beams. Microlenses are disposed between the semiconductor substrate and the optical diffuser in respective alignment with the emitters and configured to steer the beams at different, respective angles, which are selected so that at least some of the chief rays cross one another before passing through the diffuser.

Flood projector with microlens array

One disclosed embodiment includes techniques for temperature-dependent reference image correction in structured light projectors that may be used for generating three-dimensional (3D) scene depth maps. The techniques disclosed herein include receiving an indication of a temperature (e.g., an actual current operating temperature or a change in the current operating temperature relative to an established reference temperature) associated with one or more components of a projector and then determining, based on the temperature indication, an amount of adjustment needed to correct a reference pattern image based on an estimated effective focal length change of the projector. Next, a reference pattern image may be appropriately adjusted, e.g., based on the determined amount of effective focal length adjustment caused by the current operating temperature of the projector, to generate a corrected reference image, which may then be used to generate a more accurate 3D scene depth maps at the projector's current operating temperature.

Systems and methods for performing temperature-dependent reference image correction for light projectors

An optical apparatus includes a transparent envelope having opposing first and second faces. An electro-optic material is contained within the transparent envelope and includes molecules oriented in respective predefined directions selected so as to form a geometric-phase structure across an area of the transparent envelope. First and second transparent electrodes are disposed respectively across the first and second faces of the transparent envelope. A controller is coupled to apply a voltage between the first and second transparent electrodes that is sufficient to displace the molecules of the electro-optic material from the predefined directions.

Switchable flood and spot illuminator

An opto-electronic device includes a semiconductor substrate having a planar surface. An emitter is formed on the substrate and configured to emit a beam of light away from the planar surface. A reflective layer is formed on the planar surface adjacent to the emitter. A transparent layer is formed over the planar surface and has a curved outer surface including a first segment positioned vertically over the emitter and configured to internally reflect the emitted beam of light toward the reflective layer, and a second segment positioned and configured to collimate and transmit the beam reflected from the reflective layer.

Integrated optical emitters and applications thereof

An electronic device may have a display with an array of pixels for displaying images. The display may have a window region. During operation, a component such as an optical component may operate through the window region. The window region may overlap a movable portion of the display. The window region may be operated in open and closed states. In the closed state, the movable portion of the display overlaps the window region and pixels in the movable display portion emit light through the window region. In the open state, the movable portion of the display is moved away from the window region so that light for the optical component may pass through the window region. The optical component may be a camera or other component that receives light through the window region or may be an optical component that emits light through the window region.

Electronic devices with adjustable display windows

Imaging apparatus includes a housing, with imaging optics mounted in the housing and configured to form an optical image, at a focal plane within the housing, of an object outside the housing. An image sensor, including a matrix of detector elements, is positioned at the focal plane in alignment with the imaging optics and is configured to output an electronic image signal in response to optical radiation that is incident on the detector elements. At least one emitter is fixed within the housing and is configured to emit a test beam toward one or more reflective surfaces within the housing, which reflect the test beam toward the image sensor. A processor is configured to process the electronic image signal output by the image sensor in response to the reflected test beam so as to detect a change in the alignment of the image sensor with the imaging optics.

Detecting loss of alignment of optical imaging modules

Imaging apparatus includes an illumination subassembly, which is configured to project onto an object a pattern of monochromatic optical radiation in a given wavelength band. An imaging subassembly includes an image sensor, which is configured both to capture a first, monochromatic image of the pattern on the object by receiving the monochromatic optical radiation reflected from the object and to capture a second, color image of the object by receiving polychromatic optical radiation, and to output first and second image signals responsively to the first and second images, respectively. A processor is configured to process the first and second signals so as to generate and output a depth map of the object in registration with the color image.

Three-dimensional mapping and imaging

Growing community of inventors

Givatayim, Israel

Assaf Avraham