Fujitsu Corporation

Fujitsu Microelectronics Limited

Fujitsu Semiconductor Limited

Asao Kokubo

Hiroshi Daiku

Jun Funakoshi

Shigeru Nishio

Tsuyoshi Higuchi

Katsuyoshi Yamamoto

Norihiro Yoshida

Yutaka Takeda

Masatoshi Kokubun

Toshitaka Mizuguchi

Yuji Segawa

An electronic apparatus includes: a clock generation section which generates and outputs a clock of a frequency according to a state; and an MPU and a DSP which, being supplied with the clock generated by the clock generation section, execute processes at a processing speed synchronized with the clock. The electronic apparatus further includes: a load prediction section which predicts a DSP load based on a DSP application to be executed now out of DSP applications installed by being coded for processing by the DSP as well as on a frequency of a clock currently being outputted from the clock generation section; and a load allocation section which allocates part of processes of the DSP application to be executed now to the MPU, based on the load predicted by the load prediction section and thereby makes the MPU execute the part of processes.

Electronic apparatus and storage medium storing load distribution program

The challenge of the present invention is to suppress a variation in brightness of an image and make a reference value of a black level converge at an appropriate value in a short time. A condition judgment circuit judges whether or not a frame of an amount of change in gains of a variable gain amplifier being equal to or greater than a threshold continues for a predefined frames or more. If a frame of an amount of change in the gains being equal to or greater than the threshold continues for the predefined frames, a black level value of the current frame is set for new black level reference. If not continues for the predetermined number, the previous black level reference value is retained in lieu of correcting the black level.

Semiconductor integrated apparatus and black level correction method for image sensor

A semiconductor integrated circuit includes a check unit which compares a value of a pixel of interest with values of neighboring pixels contained in an image signal supplied from an image sensor, and determines based on the comparison whether the pixel of interest is defective, and a defect correcting unit which corrects the value of the pixel of interest by using values of surrounding pixels in response to the determination by the check unit that the pixel of interest is defective.

Circuit and method for correction of defect pixel

An automatic gain control circuit generates, based on comparison between an average brightness of brightness data output for each frame from an image sensor and a target brightness, an integration time adjustment signal for adjusting an integration time during which the image sensor is exposed, a gain adjustment signal for adjusting gain of an amplifier that amplifies an output signal of the image sensor, and a frame rate adjustment signal for changing a frame rate. The automatic gain control circuit includes an exposure control circuit for adjusting a blanking time of each frame and generating, as the frame rate adjustment signal, a maximum integration time adjustment signal for switching a maximum integration time of the image sensor.

Automatic gain control circuit with exposure control circuit

A solid-state imaging device includes an image sensor configured to output image data generated by image sensing elements together with a timing signal, and an image processing unit configured to output the image data supplied from the image sensor having undergone predetermined signal processing a predetermined delay time after a timing indicated by the timing signal, the image sensor further configured to make the timing signal indicate a first timing that is at least the processing delay time earlier than a second timing indicative of a start of a valid period of the image data, and to output dummy data from the first timing to the start of the valid period of the image data.

Reduction of effect of image processing on image sensor

An imaging device provided with a read circuit in which a light-shielding region is formed in a part of an image region where a plurality of optical/electrical conversion devices is two-dimensionally arrayed in the row and column directions and which converts a optically detected signal outputted from each of the optical/electrical conversion devices for each of the column into a digital signal, comprises a storage device for storing the outputted digital signal outputted in relation with the optical/electrical conversion device in the light-shielding region and a difference calculation device for calculating a difference between the outputted digital signal in relation with the optical/electrical conversion device in a light-receiving region except the light-shielding region and a value stored in the storage device.

Imaging device with light-shielding region, control method thereof and CMOS image sensor with light-shielding region

A flicker noise detecting method that shortens the time for detecting flicker noise. The method sets two of a plurality of horizontal lines forming a frame as average brightness calculation regions that are separated from each other by the predetermined number of the horizontal lines, calculates an average brightness of the two average brightness calculation regions for each of three frames, multiplies each average brightness by a product sum calculation coefficient, and adds the products to generate a sum and generate a detection signal of flicker noise based on the sum. The product sum calculation coefficient is obtained by plotting one cycle of a sine wave and one cycle of a cosine wave at intervals of &#x3c0;/3.

Method and circuit for detecting flicker noise

An image processing circuit for a color image sensor, comprising a color sensitivity correction circuit which adds/subtracts a predetermined offset to/from pixel signals being output by amplifying photoelectric conversion signals of pixels, which have photoelectric conversion element and are arranged in column and row directions, for each column, and multiplies the result by a predetermined gain, wherein the predetermined offset includes a first offset, which is set according to each color, and a second offset, which is set according to a plurality of columns. According to the present invention, the offset of the color sensitivity correction circuit includes a first offset, which is set according to each color, and a second offset, which is set according to a plurality of columns, therefore, periodic moir&#xe9; in the vertical direction, which is caused by the column output circuit and the output signal supply circuit for each column, can be suppressed, and image quality can be improved.

Image processing circuit providing improved image quality

A semiconductor integrated circuit includes a differential calculating unit which obtains a differential between a value of a pixel of interest and values of surrounding pixels contained in an image signal supplied from an image sensor, a dead-zone generating unit which defines a predetermined range of pixel values, and a comparison unit which checks whether the differential falls outside the predetermined range, wherein contour enhancement is applied to the pixel of interest in response to a determination by the comparison unit that the differential falls outside the predetermined range.

Circuit and method for contour enhancement

A circuit for correction of white pixel defects capable of complementing white pixel faults without using a storage device for holding white pixel fault spots, and an image sensor using the circuit for correction of white pixel defects. Pixels constituting a pixel section are sequentially subjected to white pixel fault complementation process. A nearby pixel data holding section acquires pixel data from a readout circuit and holds the data. A comparison-determination section compares lightness of a target pixel with that of a nearby pixel and determines, based on the comparison result, whether or not the target pixel is associated with a white pixel fault having a lightness higher than that of the nearby pixel by a predetermined value or more. When it is judged by the comparison-determination section that the target pixel is associated with a white pixel fault, a complementary calculation section performs a complementary calculation by using the pixel data of the target and nearby pixels held by the nearby pixel data holding section, to generate complemented data.

Circuit for correction of white pixel defects and an image sensor using the circuit for correction of white pixel defects

The switched capacitor filter circuit comprises an amplifier whose feedback capacitance Cf is variable. This feedback capacitance is changed based on the control signals received from the outside. Two switches control charging/discharging of a first capacitor. Another Two switches control charging/discharging of a second capacitor. Frequency f of a signal for switching the four switches is changed so that a beat frequency varies within a range having no influence with respect to a cutoff frequency while always keeping a value of the f /Cf constant.

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Kawasaki, Japan

Asao Kokubo