Lsi Logic Corporation

Arun Ramakrishnan

Farshad Ghahghahi

Anand Govind

Aritharan Thurairajaratnam

Leah Miller

A pattern of contacts that includes high speed transmitter contacts disposed in a first portion of the pattern, where the high speed transmitter contacts are disposed in transmitter differential pairs. High speed receiver contacts are disposed in a second portion of the pattern, where the first portion of the pattern is not interspersed with the second portion of the pattern, and the high speed receiver contacts are disposed in receiver differential pairs. At least one unbroken line of other contacts is disposed between the first portion of the pattern and the second portion of the pattern, where the other contacts do not contain any high speed transmitter contacts and high speed receiver contacts. Low speed IO contacts are disposed in a third portion of the pattern, where the third portion of the pattern is disposed in an interior portion of the pattern relative to both the first portion of the pattern and the second portion of the pattern. Substantially all of the contacts are disposed at a standard pitch one from another on a single contact surface.

Ball assignment system

A flip chip substrate is provided, which includes a plurality of conductive layers, including a top layer and a bottom layer. A first plurality of contacts, including first and second contacts corresponding to a differential signal pair, are arranged on the top layer within a die bonding area. A second plurality of contacts, including third and fourth contacts corresponding to the differential signal pair, are arranged on the bottom layer. First and second traces are routed between the first and third contacts and between the second and fourth contacts, respectively, wherein the second trace is routed out of the die bonding area on a different layer than the first trace. The traces are routed in a manner that reduces the length difference between the traces.

Routing scheme for differential pairs in flip chip substrates

The present disclosure is directed to ball assignment schemes for ball grid array packages in integrated circuits with increased signal count. The ball assignment scheme includes an array of electrical contacts. The array has a first diagonal including a pair of signal contacts adjacent to a pair of first-type voltage supply contacts. The array further includes a crossing diagonal having a pair of adjacent second-type voltage supply contacts, which crosses the first diagonal between the pair of signal contacts such that the pair of second-type voltage supply contacts oppose one another relative to the first diagonal.

Ball assignment schemes for integrated circuit packages

A substrate having a core with vias disposed therein. A reference layer is formed on the core, with voids in the reference layer that are formed around the vias in the core. Traces on a routing layer overlie the reference layer. Also included is a contact layer with contacts disposed in a contact pattern. The core is logically divided into sections, and the vias within a given one of the sections are aligned in rows substantially along a first direction. At least a portion of the vias are not aligned with the contact pattern. The voids in the reference layer within the given one of the sections are also aligned in rows substantially along the first direction and aligned with the vias. Further, the traces within the given one of each of the sections are also aligned substantially along the first direction between the rows of voids, and not substantially overlying the rows of voids.

Routing for reducing impedance distortions

A substrate that includes a non-electrically conductive core having a first side and an opposing second side. A first electrically conductive layer is disposed on the first side of the core, and a second electrically conductive layer is disposed on the second side of the core. Electrically conductive core vias extend from the first side of the core to the second side of the core. The core vias are disposed in an array. An electrically conductive contact is formed on an upper build-up layer on the first side of the core, and overlies the array of core vias. A first electrically conductive via electrically connects the contact to an intervening build-up layer disposed between the upper build-up layer and the first electrically conductive layer. The first via overlies the core via array. A second electrically conductive via electrically connects the intervening build-up layer and the first electrically conductive layer, where the second electrically conductive via is not disposed over the core via array.

Growing community of inventors

Sunnyvale, CA, United States of America

Arun Ramakrishnan