Abb Schweiz Ag

Arun Kumar Kadavelugu

Eddy C Aeloiza

Sandeep Bala

James Stoupis

Liming Liu

Bandeep Singh

David Coats

Maziar Mobarrez

Jukka-Pekka Sjoroos

Joonas Puukko

An inverter is provided. The inverter includes a DC bus having positive and negative rails and an inverter arm coupled between the positive and negative rails of the DC bus. The inverter arm includes first and second silicon carbide transistor having a current-conducting terminals connected to a central node of the inverter arm. The inverter further includes at least one silicon transistor having a third current-conducting terminal connected to the central node of the inverter arm. The inverter further includes a gate driver circuit configured to switch the first silicon carbide transistor and the second silicon carbide transistor to convert DC from said DC bus into AC, and to switch said at least one silicon transistor, when the inverter arm is subjected to a load-side short circuit current, to freewheel the load-side short circuit current.

Uninterruptible power supply having short circuit load capability

Systems, methods, techniques and apparatuses of a semiconductor control system are disclosed. One exemplary embodiment is a method for protecting a semiconductor switch comprising receiving a first voltage during a second blanking period following a first blanking period; determining whether a short circuit fault is occurring by comparing the first voltage to a fast detection threshold corresponding to a first value of a drain-source voltage of the semiconductor switch; if a short circuit is not occurring: receiving a second voltage after the second blanking period ends; determining whether a short circuit fault is occurring by comparing the second voltage to a slow detection threshold corresponding to a second value of the drain-source voltage; and if a short circuit fault is occurring, opening the semiconductor switch, wherein the first value of the drain-source voltage is greater than the second value of the drain-source voltage.

Short circuit protection for semiconductor switches

Devices, systems, and methods for measurement of parameters of electric power transmission lines can improve electric power usage, while wireless circuitry can provide communication from field-located devices. Connection to draw electrical power from the transmission line can be distinct from connection to sense line parameters.

On-line power measurement

A converter system includes a DC bus for each phase of an input AC power signal; a first switching cell for each phase, including first two active switches coupled in series across the DC bus and forming a first switching cell AC pole therebetween, the first switching cell AC pole being coupled to a respective phase; and a second switching cell for each phase, including second two active switches coupled in series across the DC bus and forming a second switching cell AC pole therebetween. The second switching cell AC poles are coupled to each other to form a flying neutral. One of the first switching cell and the second switching cell switches at a frequency at least an order of magnitude greater than the line frequency. The other of the first switching cell and the second switching cell switches at a frequency approximately equal to the line frequency.

Converter system for powering an electrical load

Systems, methods, techniques and apparatuses of short circuit protection are disclosed. One exemplary embodiment is a method for protecting a semiconductor switch comprising receiving a measurement corresponding to an electrical characteristic of the semiconductor switch; determining a semiconductor switch resistance value using the received measurement; estimating a junction temperature of the semiconductor switch using the semiconductor switch resistance value; determining a short circuit voltage threshold using the estimated junction temperature; comparing the short circuit voltage threshold to a test voltage corresponding to a drain-source voltage of the semiconductor switch; determining a short circuit condition is occurring in response to comparing the short circuit voltage threshold and the test voltage; and opening the semiconductor switch in response to determining the short circuit condition is occurring.

Temperature-adaptive short circuit protection for semiconductor switches

Unique systems, methods, techniques and apparatuses of semiconductor failure prognostication. One exemplary embodiment is a power converter comprising a semiconductor switch and a converter control system. The converter control system is configured to turn on the semiconductor switch, measure a first voltage and a current during reverse conduction, estimate junction temperature of the semiconductor device, turn off the semiconductor device, measure a second voltage after turning off the semiconductor device, determine a resistance value using the second voltage measurement, determine an expected resistance value, predict a failure of the semiconductor device using the resistance value and the expected resistance value, and transmit a semiconductor device failure warning.

Semiconductor failure prognostication

Unique systems, methods, techniques and apparatuses of a gate drive system are disclosed. One exemplary embodiment is a drive circuit electrically coupled to a main switching device including a first inverter, a first inverter controller, an air core transformer, at least one rectifier, at least two smoothing capacitors, a current buffer stage, and a detection circuit. The first inverter controller is structured to operate the first inverter in a first mode and a second mode. The air core transformer is structured to receive the converted AC power from the first inverter. The detection circuit is structured to detect a first mode of the first inverter and a second mode of the first inverter, and operate the current buffer stage based on a detected first mode of the inverter and a detected second mode of the first inverter.

Growing community of inventors

Raleigh, NC, United States of America

Arun Kumar Kadavelugu