Advanced Micro Devices Corporation

Arun Chandra

Thomas Burd

Brian D McMinn

William McGee

Richard L Bartolotti

Weiqing Guo

A method and apparatus for performing template-based classification of a circuit design are disclosed. A template file is read that defines a plurality of channel-connected-region (CCR) templates. A graph is formatted for each of the CCR templates. A plurality of CCRs are identified based on a partitioned netlist file that defines a given circuit design. A graph is generated for each of the identified CCRs. A matching CCR template graph is identified for each generated CCR graph. The template file may further defines super-CCR templates, and a graph may be formatted for each of the super-CCR templates. All possible combinations of CCRs and previously-matched super-CCRs that are candidates to match the formatted super-CCR template graph may be determined in an interative manner, for each formatted super-CCR template graph. A determination may be made as to which of the candidate combinations actually match the formatted super-CCR template graph.

Method and apparatus for performing template-based classification of a circuit design

A technique for constraint management and validation for template-based device designs is disclosed. The technique includes generating a template-level representation of an electronic device design based on a transistor-level representation of the electronic device design. The template-level representation includes one or more hierarchies of templates. Each template represents a corresponding portion of the electronic device design. The technique further includes determining constraint declarations associated with the electronic device design and verifying whether there is a functional equivalence between the template-level representation to a register-transfer-level (RTL) representation of the electronic device design. The technique additionally includes verifying whether the constraint declarations are valid and verifying the electronic device design responsive to verifying the functional equivalence and verifying the constraint declarations.

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Santa Clara, CA, United States of America

Arun Chandra