Qualcomm Incorporated

Arun Balachandar

Anand Bhat

Praveen Raghuraman

Nishi Bhushan Singh

Ashutosh Anand

Abhinav Kothiala

Nikhil Sudhakaran

Shankarnarayan Bhat

Sanjay Muchini

Devadatta Bhat

Embodiments contained in the disclosure provide a method for memory built-in self-testing (MBIST). The method begins when a testing program is loaded, which may be from an MBIST controller. Once the testing program is loaded MBIST testing begins. During testing, memory failures are determined and written to a failure indicator register. The writing to the failure indicator register occurs in parallel with the ongoing MBIST testing. An apparatus is also provided. The apparatus includes a memory data read/write block, a memory register, a memory addressor, and a memory read/write controller. The apparatus communicates with the memories under test through a memory address and data bus.

Method and apparatus for optimized memory test status detection and debug

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Bengaluru, India

Arun Balachandar