Texas Instruments Corporation

Arun Adoni

Sreeram Subramanyam Nasum

Suvadip Banerjee

Prajkta Vyavahare

Neeraj Bhardwaj

Pavinkumar Ramasamy

Mahit Arun Warhadpande

Shimee Gupta

Shubham Mehrotra

Binoy Jose Maliakal

Neha Vernekar

Goda Devi Addanki

Janardhan Venkata Raju

Apparatuses and methods are disclosed for handling integrated circuits in automated testing. The handler apparatus includes an upper assembly that is selectively translatable above a testing surface and a lower bracket extending from and positioned below the upper assembly. The lower bracket forms a first opening, is selectively moveable upward and downward, and includes a rotatable finger extending downward to pick up and place an integrated circuit in a socket. The handier may further include an image sensor to detect potential error conditions, and a tool extending from the lower bracket to open and close a lid on the socket. The methods include sensing an image of an integrated circuit during certain phases of testing, analyzing the image to determine if the integrated circuit is positioned correctly, and correcting any detected error conditions before continuing with the automated testing.

Handling integrated circuits in automated testing

A system includes a controller for automated test equipment (ATE) contactor to interface with a device under test (DUT) including a power converter having a primary and secondary side, each side has an input/output (I/O) pin. The controller causes the ATE contactor to apply a load current on the secondary side of the power converter at a first value and vary the load current to a second value. The contactor receives first and second indications, at the first and second load currents, of a voltage on the primary side I/O pin, a voltage on the primary side of the power converter, an input current on the primary side of the power converter, a voltage on the secondary side I/O pin, and a voltage on the secondary side of the power converter. The controller determines a primary and secondary side ATE contactor resistances based on the first and second indications.

System and method for control of automated test equipment contactor

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Arun Adoni