Spansion Llc.

Advanced Micro Devices Corporation

Arthur Benjamin Oliver

Allan Parker

Gregory Charles Yancey

Sean Michael O'Mullan

Bradley Edman Sundahl

John Anthony Darilek

James E Bowles

Ali Pourkeramati

Robert W O'Dell

Bruce R Allen

Hung K Hua

An electronic device includes an input/output (I/O) interface and a plurality of memory elements comprising a non-volatile memory portion for storing a default firmware and a working memory portion having a firmware area. The device also includes a controller coupled to the I/O interface and the memory elements, where the controller is configured for operating the memory elements, according to the firmware area, and for monitoring the I/O interface. In the device, the controller is also configured for loading the default firmware into the firmware area when the controller is enabled and for granting access to the firmware area for loading an alternate firmware if a bypass code is detected at the I/O interface.

Field upgradable firmware for electronic devices

A memory module is provided. The memory module includes die packages and a charge pump that is external the die packages. Each die package includes a flash memory device, and each of the flash memory devices includes bit lines and memory cells coupled to the bit lines. The charge pump provides a charge pump voltage that is selectively provided to the bit lines in each flash memory device in each of the die packages.

Apparatus and method for external charge pump on flash memory module

An electronic device is provided including an input/output (I/O) interface, a plurality of memory elements, a controller coupled to the I/O interface and the plurality of memory elements. In the device, the controller configured for operating the plurality of memory elements during a normal operating mode of the electronic device, where responsive to receiving a command for replacing a selected memory sector in the electronic device during the normal operating mode, the controller is configured for identifying one or more available spare memory sectors in the electronic device and modifying at least one memory map in the electronic device to replace the selected memory sector with the one of the available spare memory sectors.

Field programmable redundant memory for electronic devices

A performance enhanced simulation modeling technique is provided for optimizing integrated circuit layout. The modeling technique utilizes a performance enhanced methodology. Namely, a physical design enhances performance design to ensure that the simulation model takes into account placement and interconnect when determining whether or not the resulting integrated circuit will operate properly at required speed with actual load being applied. An initial sizing of selected devices within a network is performed using estimated time duration and load factors. Subsequently, select devices are resized according to more optimal physical time duration and load. The entire simulation modeling is achieved using computer program simulation prior to the generation of a final layout placeable upon a silicon substrate. As such, simulation methodology provides a flow to correct unexpected performance errors resulting from physical design.

Performance enhanced intergrated circuit layout methodology

In a watchdog timer, the selected codes identifying the format of a watchdog timer algorithm, such as the intervals within which a watchdog timer status must be issued by the host processor, are supplied as hardwired preset codes in programmable fuse or read only memory cells that are adapted to be programmed, but are immune from ESD, power glitches and errant software. A programmable code indicating a programmable time interval is also stored in a register protected from errant software when the watchdog timer is enabled. A selector receives the preset code and the programmable code and selects an output code indicating the time interval within which the watchdog timer must be reset by a processor status signal. The selector can be programmed to select only the preset code by supplying a selector control signal through an element that is immune from electrostatic discharge, power glitches and errant software. Also, a code fixing the watchdog timer in an on state can be supplied with ESD-immune cells. The watchdog timer employs a keyed sequence for the watchdog timer status signal.

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Austin, TX, United States of America

Arthur Benjamin Oliver