University of Florida Research Foundation Inc

Other

Arnost Neugroschel

Jerry G Fossum

Chih-Tang Sah

Fred A Lindholm

Shing-Chong Pao

Chin-Tang Sah

Franklin N Gonzalez

A direct-current current-voltage (DCIV) method enables rapid evaluation of the degradation of deep-submicron nMOSTs and pMOSTs under channel hot carrier stress resulting from a p/n junction forward biased at a safe operating voltage level.

Method for testing and diagnosing MOS transistors

A method of forming a high-low junction emitter silicon solar cell including the producing of an electron accumulation layer by oxide-charge-induction.

Oxide charge induced high low junction emitter solar cell

A new solar cell structure is provided which will increase the efficiency of polycrystalline solar cells by suppressing or completely eliminating the recombination losses due to the presence of grain boundaries. This is achieved by avoiding the formation of the p-n junction (or other types of junctions) in the grain boundaries and by eliminating the grain boundaries from the active area of the cell. This basic concept can be applied to any polycrystalline material; however, it will be most beneficial for cost-effective materials having small grains, including thin film materials.

Method of making quasi-grain boundary-free polycrystalline solar cell

A high-low junction emitter silicon solar cell including an electron accumulation layer formed by oxide-charge-induction.

Growing community of inventors

Gainesville, FL, United States of America

Arnost Neugroschel