Freescale Semiconductor,inc.

Motorola Corporation

Arnold W Yanof

William J Dauksher

Nikos Bellas

Yong Yan

Yolanda Prieto

Michael Zarubinsky

Hung Hoa Tran

Michael Skow

Konstantin Berman

Miles A Sakauye

Anoosh Adby

A device can perform gamma correction by receiving a non-gamma compensated input; selecting, in response to the input value, a selected approximating interval out of a group of low-brightness approximating intervals and out of a group of high-brightness approximating intervals; multiplying a portion of the input value by a selected approximating interval slope to provide an intermediate result; adding the intermediate result to a selected approximating interval offset to provide the gamma compensated output value; and outputting a gamma compensated output value.

Method for gamma correction and a device having gamma correction capabilities

An image processing system is disclosed which uses gain information from an input image to determine a threshold value used to filter the input image. The gain information is indicative of the amount of illumination of the input image and thus the noise level. The image processing system includes an image processor, a converter and a filter. The image processor receives and processes first image information into second image information and extracts the gain information from the first image information. The converter converts the gain information into a filter threshold, which is used by the filter to filter the second image information to provide filtered image information. The converter may include a lookup table storing noise characteristic estimates or the threshold values. The threshold values may further be based on subband size. The filter may be a wavelet-based transform denoising filter.

Gain controlled threshold in denoising filter for image signal processing

A system and method is provided for processing a digital image. The system and method processes image data by replacing bad pixel data in the digital image. Specifically, the system and method replaces bad pixel data in the image data by comparing each pixel to selected neighboring pixels, including pixels of other colors in some cases, and determining if the pixel is likely corrupt, such as from a detective pixel. Corrupted pixels are then replaced using averages, means, maximums, or other statistical functions of select nearby pixels.

System and method for bad pixel replacement in image processing

A system and method is provided for processing a digital image. The system and method processes image data by correcting for roll-off variability in the digital image. The system and method corrects for roll-off in image data by determining for each pixel a roll-off contour in which the pixel resides and adjusting that pixel based upon its roll-off contour, which in turn, depends upon its location on the image plane.

System and method for roll-off correction in image processing

A system and method for detecting flicker in a digital image. The system and method detects flicker by performing a frame-to-frame comparison of image data. The frame-to-frame comparison of image data is based on dividing each image into multiple columns, and performing a weighted sum of the pixel luminance in each column using a pattern of alternating sign weights. The weighted sum of luminance for each column in a first frame is compared to the weighted sum of luminance for that column in a second frame to determine if there is a simultaneous luminance variation in those columns. For example, if the difference between weighted sums of luminance between frames exceeds a threshold value in a predetermined number of columns then there is a simultaneous luminance variation in those columns, and a horizontal pattern of flicker has been detected in the image data.

System and method for flicker detection in digital imaging

A method and system for digital cameras provides improved automatic exposure control, improved automatic white balance, improved color interpolation, improved automatic gamma correction, and improved progressive edge enhancement. These improvements are preferably implemented in CMOS semiconductor technology for faster speed.

Digital image processing using white balance and gamma correction

A probe card (40, 55) having probe card probes (36, 56) and a method for fabricating the probe card probes (36, 56). A layer of resist (23) is formed on a plating base (21). The layer of resist (23) is exposed to radiation (32) and developed to provide angled, tapered openings (33) exposing portions of the plating base (22). An electrically conductive material is electroplated on the exposed portions of the plating base (22) and fills the angled, tapered openings (33). The layer of resist (23) and portions of the plating base (22) between the electroplated conductive material are removed. The electrically conductive material forms the probe card probes (36) which are angled and tapered. In addition, the compliant probe card probes (56) may be stair-step shaped.

Method for manufacturing a probe

A semiconductor structure (8) comprising a semiconductor chip support structure (9), a circuit board substrate (40) with circuit board substrate probes (36) extending therefrom and a method for fabricating the semiconductor structure (8). The semiconductor chip support structure (9) includes, for example, clips (43, 53) to replaceably mount semiconductor chips (47, 48) to the semiconductor chip support structure (9). The circuit board substrate (40) is mated with the semiconductor chip support structure (9) so that the circuit board substrate probes (36) contact bonding pads (49) on the semiconductor chips (47, 48). If a semiconductor chip (47, 48) becomes damaged, the circuit board substrate (40) may be separated from the semiconductor chip support structure (9) and the damaged semiconductor chip (47, 48) replaced with a good semiconductor chip (47, 48).

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Tempe, AZ, United States of America

Arnold W Yanof