Leica Microsystems Cms Gmbh

Leica Microsystems Wetzlar Gmbh

Arnold Mueller-Rentz

Christian Schumann

Christian Schulz

Albrecht Weiss

Ralf Krueger

Tobias Bauer

Klaus Hermanns

Sebastian Hitzler

Andreas Lotter

Klaus-Peter Schwaab

Stefan Motyka

A microscope for imaging a sample by a transmitted light contrasting method includes an objective lens holder configured to place an objective lens of a number of objective lenses onto an optical axis of the microscope. The microscope further includes a lens system for forming an intermediate image of an exit pupil of any one of the number of objective lenses placed onto the optical axis. The intermediate image is formed at a respective conjugated plane conjugate to the exit pupil. The microscope further includes a control device configured for automatically positioning a modulation element onto the optical axis at a positon related to the respective conjugated plane.

Microscope for transmitted light contrasting

An optical imaging device for a microscope includes an objective and an optical system configured to interact with the objective for optically imaging an object selectively in a first operating mode and a second operating mode. The optical system includes a first optical subsystem associated with the first operating mode, and a second optical subsystem associated with the second operating mode. The first optical subsystem is configured to form a first image of the object with a first magnification. The second optical subsystem is configured to form a second image of the object with a second magnification that is less than the first magnification. The second optical subsystem includes an optical module insertable into the optical path for selecting the second operating mode. The optical module includes a lens element with a positive refractive power.

Device and method for imaging an object

A microscope system includes a detection unit having a color beam splitter arrangement with three beam splitter prisms, each having first, second and third prism surfaces. The first prism surfaces face in the same direction and are oriented parallel to one another at a right angle to an optical axis. The first and second prism surfaces are oriented in each case at acute angles to one another. The second and third prism surfaces are oriented in each case at right or obtuse angles to one another. The third and first prism surfaces are oriented in each case at acute angles to one another. A prismatic compensation element having first and second prism surfaces is assigned to each prism. The second prism surface of each of the compensation elements is arranged in a common plane with or parallel to the second prism surface of the respectively assigned prism.

Microscope system and method for microscopic imaging

An illumination device for an optical device, a microscope or a macroscope includes a first illumination source configured to emit light which is directed via an illumination beam path onto an object to be illuminated that is arranged in an object plane. At least one second illumination source is positionable in the illumination beam path, and is transparent or semitransparent as well as self-luminous. The at least one second illumination source is configured to allow light emitted from the first illumination source to pass through at least in part. The object plane having the object to be illuminated is configured to be illuminated both by the first and by the at least one second illumination source.

Illumination device

A microscope illumination system includes a first light source configured to provide light along an optical axis and an aperture device including an aperture wheel that is rotatable about an axis of rotation. The aperture wheel includes a plurality of apertures of varying size disposed circumferentially on the aperture wheel. The aperture wheel is rotatable so as to dispose each of the apertures in a position that is centered on the optical axis so as to generate an illumination beam path that extends in a centered relationship with respect to the optical axis, and so as to dispose each of the apertures in a position that is off-center from the optical axis and that is within a defined region around the optical axis so as to generate an illumination beam path that extends off-center from the optical axis for oblique incident illumination.

Microscope illumination system, microscope and oblique incident illumination method

An illumination and imaging device ( ) for multiple spectral regions comprises an objective ( ) that defines an optical axis ( ). A beam splitter module ( ) is arranged in the optical axis ( ). Multiple light sources ( ), from each of which an illuminating beam path ( ) proceeds, are associated with the beam splitter module ( ). Also provided are multiple detectors ( ), associated with each of which is an imaging beam path ( ). The illuminating beam paths ( ) and imaging beam paths ( ) have a common optical path segment in which the beam splitter module ( ) is arranged. The illumination and imaging device ( ) can advantageously be used in a coordinate measuring machine ( ).

Illumination and imaging device for multiple spectral regions, and coordinate measuring machine having an illumination and imaging device for multiple spectral regions

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Brechen, Germany

Arnold Mueller-Rentz