Leica Microsystems Cms Gmbh

Intelligent Vision Gmbh

Arnold Giske

Bernd Widzgowski

Werner Knebel

Hilmar Gugel

Marcus Dyba

Jonas Foelling

Vishnu Vardhan Krishnamachari

Roland Seifert

Lars Friedrich

Wernher Fouquet

Jonas Fölling

Manuel Kremer

Lioba Kuschel

Juergen Schneider

Jochen Sieber

Fedja Bobanovic

A laser scanning microscope includes a light source configured to emit an illumination light beam. The illumination light beam has a transverse light intensity profile comprising an intensity minimum. The laser scanning microscope further includes a scanning device configured to scan the illumination light beam along a closed trajectory in a target area of a specimen, and a detector configured to detect fluorescence light emitted by a fluorophore within the target area of the specimen. The fluorophore is excited by the illumination light beam. The laser scanning microscope further includes a processor configured to determine an intensity distribution of the fluorescence light as a function of time and to determine a position of the fluorophore within the target area based on the intensity distribution of the fluorescence light.

Laser scanning microscope and method for determining a position of a fluorophore

A method for adjusting an intensity of a light beam in an optical arrangement includes passing the light beam through an acousto-optical tunable filter (AOTF). The intensity of the light beam is adjusted as a function of frequency and/or amplitude of a sound wave with which the AOTF is operated. The amplitude of the sound wave at a specified sound wave frequency is selected such that the amplitude is larger than would be required to achieve a first maximum diffraction efficiency for a specified wavelength or for a specified wavelength spectrum of the light beam. The amplitude of the sound wave is also selected such that a value of an integral of a product of the transmission function of the AOTF and the wavelength spectrum of the light beam is larger than at a value of the amplitude to be selected to achieve the first maximum.

Method for adjusting the intensity of a light beam in an optical arrangement and associated optical arrangement

The invention relates to a method for investigating a sample with regard to the lifetime of an excited state, in particular a fluorescence lifetime, and/or with regard to a property of a sample which is correlated with a lifetime of an excited state, in particular with a fluorescence lifetime, a sample region being illuminated with a sequence of excitation light pulses. The method is characterized in that the light quantity and/or number of photons of the detected light, in particular fluorescent light, proceeding from the sample region is measured temporally between the excitation light pulses exclusively within a detection time window in each case, at least two detection time windows having different temporal lengths.

Method and apparatus for investigating a sample with regard to the lifetime of an excited state

An optical device includes: a focusing optic that focuses a light beam in a focal plane; at least two phase filters for selectively focusing the light beam and effecting a phase shift of the light beam; and a filter wheel supporting the at least two phase filters which are individually introducible along an optical axis of the light beam, where the filter wheel is rotationally adjusted in relation to the optical axis by a stepper motor and linearly adjusted in an r-direction along a plane of the filter wheel by a linear adjustment mechanism.

Phase filters for a scanning microscope

A scanning microscope is described, having an illumination unit for emitting an illumination light beam, an objective for generating an elongated illumination focus in a specimen to be imaged, and a scanning apparatus for moving the illumination focus over a target region of the specimen to be illuminated by modifying the direction of incidence in which the illumination light beam is incident into an entrance pupil of the objective. The scanning apparatus directs the illumination light beam onto a sub-region of the entrance pupil offset from the pupil center in order to incline the illumination focus relative to the optical axis of the objective, and modifies the direction of incidence of the illumination light beam within that sub-region in order to move the illumination focus over the target region to be illuminated.

Scanning microscope, and method for light microscopy imaging of a specimen

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Heidelberg, Germany

Arnold Giske