Multitest Elektronische Systeme Gmbh

Arnfried Kiermeier

Max Schaule

Stefan Binder

Josef Mühlbauer

Michael Klier

A method for testing and calibrating electronic semiconductor components which convert sound into electrical signals acoustically irradiates the components in a sound chamber whose largest free length is less than half the wavelength of the highest frequency of the sound waves produced during the test.

Method and device for testing and calibrating electronic semiconductor components which convert sound into electrical signals

The technology herein relates to a handler for testing electronic components, said handler comprising an acceleration device provided with a tappet which is linearly guided by means of at least one flat spring comprising two groups of spring arms, one group being fixed to the tappet and the other group to a frame which is stationary in relation to a housing of the movement generation device. Handler comprising an acceleration device for testing electronic components.

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Oberaudorf, Germany

Arnfried Kiermeier