Infineon Technologies Ag

Arndt Voigtlaender

Mihail Jefremow

Juergen Schaefer

Ralph Mueller-Eschenbach

David Zipperstein

Rex Kho

Markus Bichl

Stefan Koeck

Wei Wang

Manoj Kumar Harihar

Holger Dienst

Ursula Kelling

Systems, devices, circuitries, and methods are disclosed for identifying, within a call instruction, context registers for storing prior to a jump to another subroutine. In one example, a method includes receiving, while executing a first subroutine, a call instruction that includes a first opcode and identifies a first target address, wherein the first target address stores instructions for performing a second subroutine. A first set of context registers identified by the call instruction is determined and the content of the first set of context registers is stored in first memory allocated for context storage for the first subroutine prior to executing the instruction stored in the first target address.

Call and return instructions for saving and restoring different sets of context registers mapped to different call opcodes

A calibration circuit, including: a signal generator circuit configured to generate a modulated analog input signal, which is based on a digital input word that is modulated; an Analog-to-Digital Converter (ADC) configured to convert an analog reference signal to a digital calibration word, wherein the analog reference signal is a low-pass-filtered version of the analog input signal generated by the signal generator circuit; and a feedback circuit configured to output the digital input word by adjusting the digital calibration word depending on a digital feedback signal, which is based on a modulated version of the analog reference signal, wherein the signal generator circuit, the ADC, and the feedback circuit are provided on a same chip.

Calibration with feedback sensing

According to an example, an electronic device includes a component, a supply line providing a supply voltage, a transistor with a control input, a linear first control loop, and a non-linear second control loop. The transistor outputs an output voltage to the component depending on a signal applied to the control input. The linear first control loop includes an ADC to convert an analog output voltage level into a digital measurement signal, a controller to generate a digital control signal for the transistor depending on the digital measurement signal, and a DAC to convert the digital control signal into a first analog control signal. The non-linear second control loop is configured to generate a second analog control signal depending on the analog output voltage level. The second analog control signal is superimposed with the first analog control signal and the combined control signals are fed to the control input of the transistor.

Electronic device

A calibration circuit, including: a first analog-to-digital converter (ADC) configured to sample a nonlinear reference signal continuously at an equidistant sampling rate to generate a reference sampled signal; a trigger timer configured to generate trigger signals; a second ADC configured to sample a point of each of the nonlinear reference signal and repeated versions of the nonlinear reference signal in response to the respective trigger signals at equidistantly increasing delays, to generate a device-under-test (DUT) sampled voltage; and processing circuitry configured to estimate a differential nonlinearity (DNL) of the DUT sampled signal, estimate a DNL of the reference sampled signal, and compare the estimated DNL of the DUT sampled signal with the estimated DNL of the reference sampled signal, to generate a DNL performance indication signal of the second ADC.

Non-linear inter-ADC calibration by time equidistant triggering

Systems, methods, and circuits are provided for facilitating negative resistance margin testing in an oscillator circuit. An example oscillator circuit includes amplifier circuitry configured to be coupled in parallel with a resonator and variable resistance circuitry configured to, in response to a resistance control signal, adjust a resistance of the oscillator circuit.

Oscillator circuit with negative resistance margin testing

A method for trimming a cycle time of an adjustable oscillator to match a Controller Area Network-bus (CAN-bus) operating with a predetermined bit time includes determining a measured number of cycles of an adjustable oscillator between a first signal and a second signal within a CAN frame transmitted on a CAN-bus; determining an information about a present cycle time of the adjustable oscillator using the measured number of cycles and a nominal number of cycles per bit time; and trimming a cycle time of an adjustable oscillator to match the CAN-bus operating with a predetermined bit time based on the determined information.

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Ottobrunn, Germany

Arndt Voigtlaender