El-mul Technologies Ltd

Soreq Nuclear Research Center

Clear-cut Medical Ltd.

Armin Schon

Eli Cheifetz

Dmitry Shur

Semyon Shofman

David Vartsky

Pinchas Gilad

Eli Chefetz

Doron Bar

Eitan Pinhasi

A scintillator assembly including an entrance surface for receiving charged particles into the scintillator assembly, the charged particles including first charged particles at a first energy level and second charged particles at a second energy level. A first scintillator structure configured for receiving the first charged particles and generating a corresponding first signal formed of first photons with a first wavelength of &#x3bb;1, a second scintillator structure configured for receiving the second charged particles and generating a corresponding second signal of second photons with a second wavelength of &#x3bb;2, and an emitting surface for egress of a combined signal from the scintillator assembly, the combined signal including the first and second photons, and at least one beam splitter for receiving the combined signal and separating the combined signal to first and second photons.

Charged particle detection system

A system includes an NMR system () including a coil () and a magnet () capable of obtaining NMR information from a tissue () and an MRI processor () for creating a pixel map of the tissue () from the NMR information. The system also includes an OCT system () with an OCT processor () capable of creating an optical coherence tomography of the tissue (). A tissue sample holder () is coupled to a manipulator to move the tissue sample holder () to the NMR system () for creating the pixel map of the tissue () and to move the tissue sample holder () to the OCT system () for creating the optical coherence tomography of the tissue ().

Hybrid NMR and OCT system

The present invention produces strings of true random numbers, extracted from field emission of electrons from nano-size emitters (NSE). Electrons may be produced in a miniature, three-electrode vacuum element that consists of a NSE emitter attached to the cathode surface, a close proximity gate electrode and an accelerating electrode (anode). A miniature fast response electron detector may also be inserted into the vacuum vessel. The detector sensitivity may allow single electron detection, with a noise level much lower than the resulting single-electron signal. The accelerated electrons may be directed to the detector and produce electric signals with well-defined pulse height and pulse shape characteristics. The electronic system analyzes the signals from the detector and generates random numbers thereby.

High-speed, true random-number generator

The invention discloses a charged particle detecting apparatus for detecting positive ions, negative ions and electrons emitted from a sample, the apparatus comprising a housing, defining a chamber in its interior, which is confined by conductive walls, and has an opening to the outside of said housing; a grid for selectively attracting charged particles, wherein the grid is electrically biasable with respect to said housing and functionally aligned with said opening; a converter arrangement with a converter surface, which is electrically biasable with respect to the grid and with respect to the housing, and which is positioned such that charged particles attracted into the chamber by the grid impact on the converter surface; an electron detector, which is biasable with respect to the converter surface in such a way that electrons emitted from the converter surface impact on the electron detector.

Three modes particle detector

A multi-purpose efficient charge particle detector that by switching bias voltages measures either secondary ions, or secondary electrons (SE) from a sample, or secondary electrons that originate from back scattered electrons (SE3), is described. The basic version of the detector structure and two stripped down versions enable its use for the following detection combinations: The major version is for measuring secondary ions, or secondary electrons from the sample, or secondary electrons due to back-scattered electrons that hit parts other than the sample together or without secondary electrons from the sample. Measuring secondary ions or secondary electrons from the sample (no SE3). Measuring secondary electrons from the sample and/or secondary electrons resulting from back-scattered electrons hitting objects other than the sample (no ions).

Particle detector for secondary ions and direct and or indirect secondary electrons

An ion detector having a planar electrically conducting entrance plate, a converter assembly including a planar electrically conducting converter plate and a converter member for providing free electrons upon impact of ions, a planar electrically conducting exit plate having an exit window, a magnet assembly, and an electron detection assembly. The planes of the converter plate and the entrance plate are parallel and electrically biasable in order to provide a homogeneous electric field. The magnet assembly provides a homogenous magnetic field between the converter plate and the exit plate, the magnetic field extending parallel to the plane of the converter plate. The ratio between the electric and the magnetic field is such that the electrons emitted from the converter plate travel to the exit window and are detected by the electron detection assembly.

Growing community of inventors

Nes Ziona, Israel

Armin Schon