Infineon Technologies Ag

Armin Rettenberger

Stefan Dietrich

Peter Mayer

Matthias Grewe

A method for testing an electronic module having a memory cell device includes writing an information item to the memory cell device at a first clock frequency and then reading-out the information item from the memory cell device at a second clock frequency. The read out information item is reflected at a reflection point and is written back to the memory cell device at the second clock frequency. The reflected information unit is then read-out from the memory cell device with the first clock frequency.

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Munich, Germany

Armin Rettenberger