Intel Corporation

Arjun Krishnan

Nisha Ananthakrishnan

Yiqun Bai

Yonghao Xiu

Suriyakala Ramalingam

Saikumar Jayaraman

James Chris Matayabas, Jr

Xavier Francois Brun

Rajendra C Dias

Manish Dubey

Purushotham Kaushik Muthur Srinath

Sivakumar Nagarajan

Hitesh Arora

Yuying Wei

Randall D Lowe, Jr

Beverly J Canham

Dingying David Xu

Anna M Prakash

Mohit Mamodia

James C Matayabas

Methods of forming a microelectronic packaging structure and associated structures formed thereby are described. Those methods and structures may include modifying an underfill material with one of a thiol adhesion promoter, an azole coupling agent, surface modified filler, and peroxide based cross-linking polymer chemistries to greatly enhance adhesion in package structures utilizing the embodiments herein.

Methods of promoting adhesion between underfill and conductive bumps and structures formed thereby

Some example forms relate to a stiffener tape for a wafer. The stiffener tape includes a mounting tape and a stiffener removably attached to the mounting tape. The stiffener tape further includes a die attach film attached to the stiffener. Other example forms relate to an electronic assembly that includes a wafer and a stiffener tape attached to the wafer. The stiffener tape includes a die attach film mounted to the wafer. A stiffener is attached to the die attach film and a mounting tape is removably attached to the stiffener. Still other example forms relate to a method that includes forming a stiffener tape which includes a mounting tape, a stiffener removably attached to the mounting tape and a die attach film attached to the stiffener.

Stiffener tape for electronic assembly

Techniques and mechanisms for mitigating warpage of structures in a package. In an embodiment, a packaged integrated circuit device includes a mold compound disposed at least partially around an integrated circuit chip. The mold compound comprises fibers suspended in a media that is to aid in mechanical reinforcement of such fibers. The reinforced fibers contribute to mold compound properties that resist warping of the IC chip that might otherwise take place as a result of solder reflow or other processing. A modulus of elasticity of the mold compound is equal to or more than three GigePascals (3 GPa), where the modulus of elasticity corresponds to a temperature equal to two hundred and sixty degrees Celsius (260&#xb0; C.). In another embodiment, a spiral flow value of the mold compound is equal to or more than sixty five centimeters (65 cm).

Mold compound with reinforced fibers

Methods for covalently and indelibly anchoring a polyacrylate polymer using a UV-induced polymerization process in the presence of a photoinitiator to an oxide surface are disclosed herein. The methods and compositions prepared by the methods can be used as indelible marking materials for use on microelectronic packages and as solder and sealant barriers to prevent overspreading of liquids on the oxide surfaces of microelectronic packages. The polyacrylate polymers are covalently linked to the oxide surface by use during the printing and UV-curing process of an adhesion promoter having as a first domain an oxide-reactive silyl group, bonded via a linker to an acrylate-reactive group.

Robust ink formulations for durable markings on microelectronic packages and its extendibility as a barrier material for thermal and sealant materials

Methods of forming microelectronic packaging structures and associated structures formed thereby are described. Those methods and structures may include forming a wafer level underfill (WLUF) material comprising a resin material, and adding at least one of a UV absorber, a sterically hindered amine light stabilizer (HALS), an organic surface protectant (OSP), and a fluxing agent to form the WLUF material. The WLUF is then applied to a top surface of a wafer comprising a plurality of die.

Methods of forming wafer level underfill materials and structures formed thereby

A stiffener tape for a wafer. The stiffener tape includes a mounting tape; a heat spreading stiffener removably attached to the mounting tape; and an attachment film secured to the heat spreading stiffener, wherein the attachment film includes thermal conductive fillers having at least one of silver, alumina, crystalline silica, boron nitride or aluminum nitride. An electronic assembly includes a wafer; a plurality of integrated circuits on the wafer; and an attachment film covering the plurality of integrated circuits and the substrate, wherein the attachment film includes thermal conductive fillers having at least one of silver, alumina, crystalline silica, boron nitride or aluminum nitride; and a heat spreading stiffener secured to the attachment film.

Stiffener tape for electronic assembly that includes wafer or panel

An underfill composition comprises a curable resin, a plurality of filler particles loaded within the resin, the filler particles comprising at least 50 weight % of the underfill composition. The filler particles comprise first filler particles having a particle size of from 0.1 micrometers to 15 micrometers and second filler particles having a particle size of less than 100 nanometers. A viscosity of the underfill composition is less than a viscosity of a corresponding composition not including the second filler particles.

Narrow-gap flip chip underfill composition

Embodiments of the present description include methods for attaching a microelectronic device to a microelectronic substrate with interconnection structures after disposing of an underfill material on the microelectronic device, wherein filler particless within the underfill material may be repelled away from the interconnection structures prior to connecting the microelectronic device to the microelectronic structure. These methods may include inducing a charge on the interconnection structures and may include placing the interconnection structures between opposing plates and producing a bias between the opposing plates after depositing the underfill material on the interconnection structures.

Methods to prevent filler entrapment in microelectronic device to microelectronic substrate interconnection structures

Embodiments of the present description include methods for attaching a microelectronic device to a microelectronic substrate with interconnection structures after disposing of an underfill material on the microelectronic device, wherein filler particles within the underfill material may be repelled away from the interconnection structures prior to connecting the microelectronic device to the microelectronic structure. These methods may include inducing a charge on the interconnection structures and may include placing the interconnection structures between opposing plates and producing a bias between the opposing plates after depositing the underfill material on the interconnection structures.

Growing community of inventors

Chandler, AZ, United States of America

Arjun Krishnan