Growing community of inventors

Fremont, CA, United States of America

Ariel Tribble

Average Co-Inventor Count = 10.21

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 63

Ariel TribbleLisheng Gao (3 patents)Ariel TribbleAshok V Kulkarni (3 patents)Ariel TribbleKenong Wu (3 patents)Ariel TribbleDavid Winslow Randall (3 patents)Ariel TribbleMichal Kowalski (3 patents)Ariel TribbleIngrid B Peterson (2 patents)Ariel TribbleRamon Ynzunza (2 patents)Ariel TribbleKourosh Nafisi (2 patents)Ariel TribblePatrick Huet (1 patent)Ariel TribbleTong Huang (1 patent)Ariel TribbleSharon McCauley (1 patent)Ariel TribbleCecelia Anne Campochiaro (1 patent)Ariel TribbleSandeep Bhagwat (1 patent)Ariel TribbleJianxin Zhang (1 patent)Ariel TribbleVivekanand Kini (1 patent)Ariel TribbleMaruti Shanbhag (1 patent)Ariel TribbleAriel Tribble (3 patents)Lisheng GaoLisheng Gao (55 patents)Ashok V KulkarniAshok V Kulkarni (38 patents)Kenong WuKenong Wu (33 patents)David Winslow RandallDavid Winslow Randall (5 patents)Michal KowalskiMichal Kowalski (5 patents)Ingrid B PetersonIngrid B Peterson (7 patents)Ramon YnzunzaRamon Ynzunza (3 patents)Kourosh NafisiKourosh Nafisi (2 patents)Patrick HuetPatrick Huet (13 patents)Tong HuangTong Huang (9 patents)Sharon McCauleySharon McCauley (8 patents)Cecelia Anne CampochiaroCecelia Anne Campochiaro (6 patents)Sandeep BhagwatSandeep Bhagwat (5 patents)Jianxin ZhangJianxin Zhang (4 patents)Vivekanand KiniVivekanand Kini (3 patents)Maruti ShanbhagMaruti Shanbhag (2 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Kla-tencor Technologies Corporation (3 from 641 patents)


3 patents:

1. 8111900 - Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle

2. 7729529 - Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle

3. 7142992 - Flexible hybrid defect classification for semiconductor manufacturing

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as of
12/7/2025
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