Heinrich Georg Gmbh Maschinenfabrik

Arian Zeppenfeld

Volker Loth

Jost Friedrich

Günter Klappert

The invention relates to a method for analysing defects in transformer laminations using an inspection system, and to an inspection system (), wherein the inspection system comprises a detection unit (), a conveyance device () and a processing device, wherein the detection unit includes an optical detecting device (), wherein the conveyance device is used to continuously transport a plurality of transformer laminations () relative to the detecting device, wherein the detecting device is arranged transversely, preferably orthogonally, to a direction of movement of a transformer lamination, wherein a velocity of movement of a transformer lamination relative to the detecting device is measured via a measurement device () of the detection unit, wherein an image of a contour of a transformer lamination is captured with the detecting device, wherein images of a transformer lamination are assembled into a combined image of the transformer lamination via the processing device while considering the velocity of movement of the transformer lamination, wherein a shape of the transformer lamination is determined on the basis of the combined image via the processing device.

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Olpe, Germany

Arian Zeppenfeld