Samsung Electronics Co., Ltd.

Archit Tekriwal

Gaurav Gupta

Arindam Mondal

Prash Goel

Kunal Aggarwal

Aniroop Mathur

Embodiments disclosed herein relate to electronic devices, and more particularly to estimating a damage risk level for an electronic device. A method disclosed herein includes measuring motion parameters of the electronic device, on the electronic device being dropped on a surface. The method further includes classifying the surface into at least one type by processing the measured motion parameters using a classifier module. The method further includes estimating a damage risk score depicting the damage risk level for the electronic device based on the classified surface, the measured motion parameters of the electronic device, and a usage history of the electronic device.

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Bengaluru, India

Archit Tekriwal