Freescale Semiconductor,inc.

Anuruddh Sachan

Deepak Jindal

Vishal Vadhavania

A method of measuring skew between signals from an asynchronous integrated flash memory controller (IFC) includes connecting input/output (I/O) pins of the IFC to cycle based test equipment (ATE). The ATE applies a pattern of test signals as input drive to the IFC. Relative to the test cycle, the earliest delay time at which output signals from all of the I/O pins first correspond with expected results, and the latest delay time at which the output signals still correspond with the expected results are measured. The difference between the latest and the earliest delay times is compared with a limit value and a comparison report is generated.

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Noida, India

Anuruddh Sachan