Lucent Technologies Inc.

Antonio L Franco

Bradford Van Treuren

Jose M Miranda

Bryan E Peterson

The present invention provides a test vector manager for use with a unit under test (UUT). In one embodiment, the test vector manager includes a gateway device, coupled to the UUT, configured to provide a testing pathway for the UUT to coordinate test requests and responses for a backplane multi-drop test bus. The test vector manager also includes a test memory, coupled to the gateway device, configured to retrieve version-specific test vectors, which are resident on the UUT and correspond to the test requests. The test vector manager further includes a chain configuration logic unit, coupled to the test memory, configured to return the version-specific test vectors to the backplane multi-drop test bus employing the testing pathway. Alternatively, the test vector manager is further configured to connect the backplane multi-drop test bus to local UUT test bus and scan chain interfaces for tests using the version-specific test vectors.

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Naperville, IL, United States of America

Antonio L Franco