European Aeronautic Defence and Space Company Eads France

Astrium Sas

European Aernautic Defence and Space Company Eads France

Airbus Group Sas

European Aeronautic Defence and Space Company Eads

Antonin Bougerol

Florent Miller

Thierry Carriere

Nadine Buard

Patrick Heins

Cécile Weulersse

Samuel Hazo

To test a software application, a method submits an electronic board including a component implementing an application to a laser radiation generated in test equipment. The component is excited with laser pulses having very short durations distributed during complex operational phases of the component for running the application, and the reaction of the component and the application are observed.

Method for testing a software application

To produce a memory which resists ion or photon attack, a memory structure is chosen whose memory point behaves asymmetrically with regard to these attacks. It is shown that in this case, it is sufficient to have a reference cell for an identical and periodic storage structure in order to be able to correct all the memory cells assailed by an attack. An error correction efficiency of &#xbd; is thus obtained, with a simple redundancy, whereas the conventional methods make provision, for the same result, to triple the storage, to obtain a less beneficial efficiency of &#x2153;.

Method for detecting and correcting errors for a memory whose structure shows dissymmetrical behavior, corresponding memory and its use

The invention relates to an electric generator sensitive to ionizing radiation produced by the reverse mounting of a diode in parallel between a reverse polarization stack and a pulse converter or only with a pulse converter. A generator is thus provided that can be used inside a spacecraft or in the atmosphere by using cosmic radiation, or in an environment containing ionizing radiation such as in the medical or nuclear fields, and which is preferably directly mounted on a printed circuit board receiving a remote sensor.

Electric generator excited by ionizing radiations

The invention relates to a device for testing an integrated circuit. The device comprises a plate for receiving and subjecting the integrated circuit to a test. The plate comprises a component for powering and operating the integrated circuit and another component for measuring the operation of the integrated circuit during the test. The device also comprises an irradiation device for subjecting the circuit to a proton bombardment and a mask with a variable thickness provided between a bombardment access region on the integrated circuit and an established zone of the integrated circuit.

Device for testing an integrated circuit and method for implementing same

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Suresnes, France

Antonin Bougerol