Ecole Polytechnique

Centre National De La Recherche Scientifique

Other

Assistance Publique-Hopitaux De Paris

Horiba Jobin Yvon Sas

Institut Mutualiste Montsouris

Centre National De La Recherche Scientifique-Cnrs

Onera

Antonello De Martino

Bernard Drevillon

Enric Garcia-Caurel

Dominique Pagnoux

Laurent Schwartz

Denis Cattelan

Razvigor Ossikovski

Jérémy Vizet

Sandeep Manhas

Jean-Charles Vanel

Stanislas Deby

André Nazac

Bernard Huynh

Nicolas Trouve

Elise Colin Koeniguer

According to one aspect, the invention relates to a device () for remote polarimetric characterization of a sample (S). It comprises a source () for emitting at least one incident light wave at at least one first wavelength (&#x3bb;); a monomode optical fiber () in which the incident light wave is intended to propagate; a polarization state generator (PSG) arranged on the proximal side of the optical fiber; a reflector () intended to be arranged on the distal side of the optical fiber; a polarization state analyzer (PSA) arranged on the proximal side of the optical fiber and allowing, for each probe state of the incident wave generated by the polarization state generator, the polarization of the light wave obtained after propagation of the incident wave in the optical fiber (), reflection from the distal side of the optical fiber and reverse propagation in the optical fiber (), to be analyzed. Processing means () make it possible to determine, from a first polarimetric characterization of the optical fiber, a Mueller matrix (M) associated with the optical fiber, and, from a second polarimetric characterization of the assembly comprising the optical fiber and the sample, a Mueller matrix (M) associated with said assembly. The Mueller matrix (M) associated with the sample is determined from the Mueller matrices associated with the optical fiber and the assembly comprising the optical fiber and the sample, respectively.

Device and method for remote polarimetric characterization

A spectroscopic polarimetric system of broad spectral range, includes a light source suitable for emitting an incident light beam over a wavelength range, a polarization state generator (PSG), a polarization state analyzer (PSA), and a detector. The PSG and the PSA have respective elements for modulating the polarization of the light beam. The elements of the PSG for modulating polarization are suitable for generating a sequence ofpolarization states with m&#x3e;4 at each measurement wavelength, the elements of the PSA for modulating polarization are suitable for determining a sequence ofpolarization states with n&#x3e;4 for each measurement wavelength, and the detector elements are suitable for acquiring a sequence of N measurements with 16&#x3c;N&#x2266;n&#xd7;m at each wavelength to extract therefrom a polarimetric spectroscopic measurement of the Mueller matrix of the sample. An extended spectroscopic polarimetric measurement method is also described.

Device and method for taking spectroscopic polarimetric measurements in the visible and near-infrared ranges

An electronic polarimetric imaging system for a colposcopy device designed for in vivo observation of a cervix, wherein the colposcopy device includes a light source for illuminating the observable cervix and at least visual elements for monitoring an image of the cervix, the illumination optical path towards the cervix and the image optical path coming back from the cervix being separated from one another over at least one portion of the paths thereof. The system includes a polarimetric adapter housing which is removable into the separated portion of the illumination and image optical paths, the polarimetric adapter housing including a polarisation state generator (PSG) on the illumination optical path and a polarisation analyser (PSA) on the image optical path, wherein the polarisation state generator (PSG) and the polarisation analyser (PSA) are controllable. Several levels of polarimetric characterisation are possible. An adaptor housing is also disclosed.

Electronic polarimetric imaging system for a colposcopy device and an adapter housing

A Raman method and system for analysing a sample including an excitation source emitting an incident light beam, a sample holder for mounting the sample, elements for focusing the incident light beam onto the sample surface to generate a Raman scattered light having an intensity, elements for collecting the Raman scattered light to form a Raman scattered light beam, a detection system measuring intensity of the Raman scattered light beam as a function of time. The system includes at least a polarization state generator able to generate four independent polarization states or a polarization state analyzer able to analyze four independent polarization states to detect the intensity of the Raman scattered light beam and calculate a partial or complete Mueller-Stokes matrix of the sample.

Polarimetric Raman system and method for analysing a sample

Method and a polarimetric measurement device of a planar object carrying patterns repeated regularly and forming the lines of a grid. A first measurement is carried out at zero order, under an angle of incidence &#x3b8;and for a first azimuthal angle &#x3c6;, a second measurement at least is carried out at zero order, under an angle of incidence &#x3b8;and for a second azimuthal angle &#x3c6;, the polarization of the incident beam is modulated and the polarization of the reflected beam is analyzed for each measurement, theoretical polarimetric data is calculated for a model object of the real object, the model object including parameters adjustable using a formalism of electromagnetism. An iterative comparison of the measurements is conducted with the theoretical polarimetric data for different values of the adjustable parameters.

Metrological characterisation of microelectronic circuits

A broadband ellipsometer/polarimeter system for analyzing a sample includes an illumination source emitting a polychromatic light beam, a polarization state generator (PSG) including a fixed linear polarizer and a substantially achromatic retarder mounted on a rotating holder, a sample holder, a polarization state analyser (PSA) including a fixed linear polarizer and a substantially achromatic retarder mounted on a rotating holder, a primary detection system measuring the intensities at each wavelength of the light beam transmitted through the PSA, optics to collimate the beam into the PSG and into the PSA and to focus the beam into the sample surface and the detector. The linear polarizer and achromatic retarder in the PSA are identical to those of the PSG but mounted in a reverse order.

Broadband ellipsometer / polarimeter system

A liquid crystal based polarimetric system, a process for the calibration of this polarimetric system, and a polarimetric measurement process intended for measuring the representative parameters of a sample in which the polarimetric system contains an excitation section emitting a light beam that passes through a polarization state generator (PSG) and onto a sample. After reflection or transmission by the sample, the beam goes through an analysis section with a polarization state detector (PSD). The PSG and PSD each have a first and a second liquid crystal elements LC(j=1,2) having, for each LCelement of the PSG (respectively for each LCelement of the PSD), an extraordinary axis making an angle &#x3b8;(resp. &#x3b8;') with respect to the polarization direction (i), and a retardation &#x3b4;(resp (&#x3b4;&#x2032;) between its ordinary and extraordinary axes, the liquid crystals LCelements being positioned in reverse order in the PSD with respect to the LCelements of the PSG.

Liquid crystal based polarimetric system, a process for the calibration of this polarimetric system, and a polarimetric measurement process

Growing community of inventors

Massy, France

Antonello De Martino