Samsung Electronics Co., Ltd.

International Center for Quantum Optics & Quantum Technologies Limited Liability Company

Anton Sergeevich Medvedev

Sergey Nikolaevich Koptyaev

Alexey Andreevich Shchekin

Maxim Vladimirovich Riabko

Alexey Dmitrievich Lantsov

Maksim Vladimirovich Riabko

Aleksandr Shorokhov

Sang-Min Lee

Stanislav Vladimirovich Polonsky

Won-Don Joo

Vladimir Mikhailovich Semenov

Akinori Okubo

Sang-Woo Bae

Anastasiia Sergeevna Suvorina

Evgeny Andreevich Dorokhov

Seong-Keun Cho

Grigoriy Vasil'evich Lihachev

Nikolay Genad'evich Pavlov

Igor Antonovich Bilenko

Andrey Sergeevich Voloshin

Valery Evgenievich Lobanov

Eun-Hee Jeang

Mikhael Leonidovich Gorodetsky

Vladislav Valer'evich Lychagov

Gennady Dmitrievich Mammykin

Alexey Dmitrievich Dmitrievich Lantsov

Physiological parameter detecting apparatuses and methods of detecting the physiological parameters are provided. A physiological parameter detecting apparatus includes: a light source configured to emit a light onto a region of an object; an optical path converter configured to receive the light returning from the object and convert an optical path of the received light; an optical detector configured to detect the light that has the converted optical path; and a controller configured to extract physiological information of the object from the detected light.

Physiological parameter detecting apparatus and method of detecting physiological parameters

The method includes simultaneously illuminating a scene by at least two light sources, each light source emitting structured light having a spatial pattern, a wavelength and/or a polarization, wherein the spatial pattern, the wavelength and/or the polarization of each structured light differ from each other, respectively, capturing an image of the scene simultaneously illuminated by the at least two light sources by an imaging sensor through a filter array, wherein one pixel of the imaging sensor captures the image through one filter of the filter array, calculating, for each pixel, intensity values of direct and global components of the light received by the pixel from a system of equations compiled for each joint pixel, and performing, for each pixel, image correction by assigning to each pixel its calculated intensity value of the direct component to obtain a corrected image.

Multipass interference correction and material recognition based on patterned illumination without frame rate loss

A color imaging apparatus includes a filter having a meta surface, and configured to transmit only light in a first spectral region, a second spectral region and a third spectral region in a time sequence, a monochrome sensor on which the filter is disposed, and configured to acquire three different monochrome images in the time sequence by being consecutively exposed three times in synchronization with the filter, and a processor configured to acquire one color image by merging the three different monochrome images.

Color imaging apparatus using monochrome sensors for mobile devices

In a method of detecting a defect on a substrate, an incident beam may be radiated to a surface of the substrate to generate reflected light beams. A second harmonic generation (SHG) beam among the reflected light beams may be detected. The SHG beam may be generated by a defect on the substrate. A nano size defect may be detected by examining the SHG beam.

Method of detecting a defect on a substrate, apparatus for performing the same and method of manufacturing semiconductor device using the same

A biometrics authentication apparatus and a biometrics authentication method are disclosed. The biometrics authentication apparatus includes: a light source configured to emit a light; a modulator configured to change a spatial distribution of the light that is scattered and reflected from a region of interest of a user; a detector configured to detect an integral power of the light that is scattered from the region of interest; and a processor configured to obtain a measurement signal based on the integral power of the light, compare the measurement signal with a reference signal stored in a memory, and determine whether to authenticate the user based on a degree of match between the measurement signal and the reference signal.

Device and method for biometrics authentication

Provided is an optical source apparatus that may generate two different optical frequency combs. The optical source apparatus includes an optical resonator and a continuous wave laser emitting laser light having a spectrum component corresponding to a resonance frequency of the optical resonator, and the optical resonator is configured to generate a first frequency comb and a second frequency comb having different modes by interacting with the laser light emitted by the continuous wave laser.

Optical dual-comb source apparatuses including optical microresonator

Provided is an optical measurement system. The optical measurement system includes: an optical module which includes an optical system and which is configured to illuminate a sample and register a defocused image of a nanostructured surface of the sample, an optical system parameter control module configured to set optical parameters of the optical system, an optical transfer function (OTF) measurement module configured to measure an OTF, a defocused image calculation module configured to calculate the defocused image based on the measured OTF and the optical parameters, and a critical dimension (CD) evaluation module configured to compare the registered defocused image with the calculated defocused image of the nanostructured surface of the sample and to output a CD value of the nanostructured surface.

Optical measurement system and method for measuring critical dimension of nanostructure

Growing community of inventors

Moscow, Russia

Anton Sergeevich Medvedev