Centre National De La Recherche Scientifique

Sorbonne Université

Université De Paris

Universite Paris Cité

Paris Sciences Et Lettres

Paris Sciences Et Lettres Paris

Antoine Niguès

Alessandro Siria

Lydéric Bocquet

Laetitia Jubin

The present invention relates to a system for controlled deposition of a fluid on a substrate and also to a method employing the system. The system comprises:

System for controlled depositing of a fluid on a substrate

The present invention relates to an atomic force microscope for evaluating a surface of a sample, comprising a sample holder, having a first zone suitable for receiving the sample mounted in a stationary manner, a probe having a tip able to be positioned facing the surface of the sample, the microscope being configured to allow an adjustment of a position of the tip relative to the surface, and a support, the sample holder having at least one second zone, separate from the first zone and stationary relative to the support, the sample holder being deformable so as to allow a relative movement of the first zone with respect to the second zone, and the microscope comprising a detector able to detect a movement of the first zone relative to the second zone.

Atomic force microscope

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Paris, France

Antoine Niguès