Anasys Instruments Corporation

Anthony Kurtz

Craig Prater

Kevin Kjoller

Doug Gotthard

Roshan Shetty

Michael Reading

Michael Lo

Khoren Sahagian

Dynamic IR radiation power control, beam steering and focus adjustment for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination with a beam from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise. Beam alignment and focus optimization as a function of wavelength are automatically performed.

Dynamic power control, beam alignment and focus for nanoscale spectroscopy

A system and method for automatic analysis of temperature transition data over an area of a sample surface. The system relies on the use of a microfabricated probe, which can be rapidly heated and cooled and has a sharp tip to provide high spatial resolution. The system also has fast x-y-z positioners, data collection, and algorithms that allow automatic analysis of and visualization of temperature transition data.

Transition temperature microscopy

Growing community of inventors

Ventura, CA, United States of America

Anthony Kurtz