International Business Machines Corporation

Anthony K Stevens

Douglas E Sprague

Donald L LaCroix

Sally S Botala

Randolph P Steel

Dale B Grosch

A method, system and software for automatically generating a test environment for testing a plurality of devices (DUTs) under test in a test system. The multiple devices are tested by mapping the plurality of DUTs into pins of the tester system to create pin data; inputting into a test program generator pattern data, generic test program rules and the pin data; generating a multi-DUT test program and multi-DUT pattern data; and controlling the test system through the test program. The resulting fail data is then logged to each DUT.

Growing community of inventors

Underhill, VT, United States of America

Anthony K Stevens