International Business Machines Corporation

Anthony J Abrami

Santiago E Del Puerto

Gene J Gaudenzi

Giulio DiGiacomo

Paul M Gaschke

Mark R LaForce

Maurizio Arienzo

Kort F Longenbach

Paul V McLaughlin

Stuart H Bullard

Paul J Roggemann

A multi-layer module that has incorporated therein an additional sheet with a heat generating film resistor formed thereon. A temperature responsive controller regulates the film resistor current in order to regulate the temperature at the surface of the module. The invention is applicable to both single chip and multiple chip modules, and for multi-chip modules a plurality of discrete film resistors on a single may be used.

Temperature controlled multi-layer module

A wafer chuck temperature control system is disclosed for use in a semiconductor wafer testing apparatus. The wafer chuck is divided into a plurality of temperature sensor and cooling element domains corresponding to chip location regions of an overlying undiced wafer being tested. Computer scanning of the sensors determines which domain is the one harboring the heat source (chip under test) and selects the same for connection to a closed loop temperature control feedback servo. Provision also is made for introducing a helium gas interface between the wafer and the chuck by placing annular grooves in the face of the chuck through which the helium flows when the wafer is vacuum-seated against the chuck. A predetermined helium gas flow rate is maintained to preserve vacuum holddown and to optimize the thermal resistance of the wafer-chuck interface.

Dry interface thermal chuck temperature control system for semiconductor

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Poughkeepsie, NY, United States of America

Anthony J Abrami