Dell Products Inc.

Emc IP Holding Company LLC

Anthony Gerard Ginty

Gregory M Allen

Frank Widjaja Yu

Joseph Sullivan

Conor Ryan

Jeffrey James DeMoss

Ricardo V Dominguez

Cline W Frasier

Colm Murphy

Methods and systems for storing data are disclosed. Data may be stored in persistent storage of storage devices. When a storage device is likely to become depowered, an expedited data refresh procedure may be performed. The expedited refresh procedures may improve the likelihood that the data is able to be retrieved from the persistent storage after the storage device is repowered. The expedite refresh procedures may be prioritized to complete the procedures prior to the storage devices being depowered.

Unpower data retention for solid state drives

A storage device self-heating system includes a storage device having a processing system, a storage subsystem, and at least one heat transfer subsystem coupled between the processing system and the storage subsystem. The storage device determines that a temperature of the storage subsystem is below a temperature threshold and, in response, uses the processing system to perform a plurality of computations that are configured to generate an amount of heat that, when transferred via the heat transfer subsystem(s), raises the temperature of the storage subsystem. The heat transfer subsystem(s) transfer heat generated via the performance of the plurality of computations to the storage subsystem, and when the storage device determines that the temperature of the storage subsystem is above the temperature threshold, it performs at least one storage operation.

Storage device self-heating system

A storage device write-read error reduction system includes a computing device that includes a storage device. The storage device determines, at a temperature that is within a predefined temperature range, that a storage device background operation should be performed and, in response, identifies data that is stored in the storage device and that was written to the storage device outside the predefined temperature range. The storage device then prioritizes the data that was written to the storage device outside the predefined temperature range over data that was written to the storage device within the predefined temperature range and, based on that prioritization, performs the storage device background operation to rewrite the data to the storage device.

Storage device write-read error reduction system

In one or more embodiments, one or more systems, one or more methods, and/or one or more processes may receive a scaling factor and a retention time power law coefficient associated with a solid state drive (SSD); determine a first raw bit error rate (RBER) value for the SSD at a first time; extrapolate a second time at which a second RBER value for the SSD would reach a maximum RBER value if left unpowered, based at least on the first raw bit error rate value, the scaling factor, and the retention time power law coefficient; and provide the second time at which the second RBER value for the SSD would reach the maximum raw bit error rate value if left unpowered to at least one of an information handling system (IHS), IHS firmware, a baseboard management controller of the IHS, and an application executing on the IHS.

System and method of forecasting an amount of time a solid state drive can be unpowered

A storage device projected temperature environment configuration system includes storage devices with the same physical hardware configuration, and a computing device manufacturing system that manufactures computing devices. A storage device projected temperature environment configuration subsystem in the computing device manufacturing system identifies a first projected temperature environment for a first computing device being manufactured by the computing device manufacturing system, configures a first subset of the storage devices to perform first storage device operations in the first projected temperature environment, identifies a second projected temperature environment that is for a second computing device being manufactured by the computing device manufacturing system and that is different than the first projected temperature environment, and configures a second subset of the storage devices to perform second storage device operations in the second projected temperature environment that are different than the first storage device operations.

Storage device projected temperature environment configuration system

A method, system, and computer program product for increasing the life of a NAND flash, the method comprising selecting a set of internal control parameters for the NAND flash and optimizing the set of internal control parameters with a genetic algorithm to find an improved set of control parameters.

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Cork, Ireland

Anthony Gerard Ginty