Em Microelectronic-marin Sa

Antal Banyai

Pascal Kunz

Olivier Rey

The present invention concerns a method for measuring a chip integrated structure (,) including at least one coil (,) having a plurality of turns (,). The present invention is characterized on the following steps: measuring the resistance across the terminals of first and second portions of said coil (,), corresponding to two different numbers of turns of the coil; computing the ratio of the measured resistances across the terminals of first and second portions of the coil (,); comparing the ratio to a constant measured from a sample of resistance measurements made on coils of identical geometry; and determining the presence or the absence of a short circuit between at least two turns of one of said portions of said coil (,), when the ratio is different from or equal to said constant respectively. The present invention further concerns an integrated circuit which is able to allow implementation of the above mentioned measuring method.

Measuring method for detecting a short-circuit between the turns of a coil integrated on a chip, and integrated circuit structure adapted to such a measuring method

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Neuchâtel, Switzerland

Antal Banyai