Bidirectional Display, Inc.

Analog Devices,inc.

Anping Liu

Hsuan-Yeh Chang

Junhua Shen

Akira Shikata

The present disclosure provides an optical-capacitive sensor panel device. In one aspect, the panel device includes a transparent substrate having a first surface; an optical sensor array formed on the first surface of the transparent substrate, the optical sensor array including a plurality of photosensitive pixels spaced apart from each other and arranged on the first surface to form a lattice structure; a plurality of row electrodes formed on the optical sensor array and electrically coupled to a first group of the photosensitive pixels; a plurality of column electrodes formed on the optical sensor array crossing the row electrodes and electrically coupled to a second group of the photosensitive pixels; and an insulating layer formed between the row electrodes and the column electrodes.

Optical-capacitive sensor panel device and method for manufacturing same

The present disclosure provides an image sensor panel and a method for capturing graphical information using the image sensor panel. In one aspect, the image sensor panel includes a substrate and a sensor array on the substrate, the sensor array including a plurality of photosensitive pixels. The substrate includes a first region defined by the sensor array and a second region other than the first region. The second region is optically transparent and has an area greater than that of the first region.

Image sensor panel and method for capturing graphical information using same

A conversion time and an acquisition time of an ADC can be estimated so that a speed of the ADC can be calibrated. An ADC circuit can perform M bit-trials in its conversion phase and continue performing additional bit-trials in a calibration mode. The ADC can count the number of additional bit-trials performed, e.g., X bit-trials, that occur before the next conversion phase, where additional bit-trials can be considered to be the number of available bit-trials during an acquisition time if the ADC continues performing bit-trials instead of sampling an input signal. The ADC can estimate the conversion time and the acquisition time using M and X. Then, the conversion time of the ADC can be calibrated by adjusting one or more of the comparison time, DAC settling delay, and logic propagation delay.

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Acton, MA, United States of America

Anping Liu