Applied Materials Israel Limited

Braemar Manufacturing LLC

Lifewatch Technologies Ltd.

Anna Levant

Rafael Bistritzer

Konstantin Chirko

Yossi Lovton

Michael Chemama

Mordehay Amirim

Moshe Eliasof

Zohar Brachia Halevi

Tamir Einy

Yarden Zohar

Asher Ben-Haim

There is provided an image generation system and method. The method comprises obtaining a runtime image of a semiconductor specimen with a low Signal-to-noise ratio (SNR), and processing the runtime image using a machine learning (ML) model to obtain an output image with a high SNR. The ML model is previously trained using a training set comprising a plurality of low SNR images associated with a high SNR image. The plurality of low SNR images correspond to a plurality of sequences of frames acquired in a plurality of runs of scanning a first site of the specimen. The high SNR image is generated based on the plurality of low SNR images. The training comprises, for each low SNR image: processing the low SNR image by the ML model to obtain predicted image data, and optimizing the ML model based on the predicted image data and the high SNR image.

Image denoising for examination of a semiconductor specimen

There is provided a system and a method comprising obtaining a first (respectively second) image of an area of the semiconductor specimen acquired by an electron beam examination tool at a first (respectively second) illumination angle, determining a plurality of height values informative of a height profile of the specimen in the area, the determination comprising solving an optimization problem which comprises a plurality of functions, each function being representative of a difference between data informative of a grey level intensity at a first location in the first image and data informative of a grey level intensity at a second location in the second image, wherein, for each function, the second location is determined with respect to the first location, or conversely, when solving the optimization problem, wherein a distance between the first and the second locations depends on the height profile, and the first and second illumination angles.

Geometry based three dimensional reconstruction of a semiconductor specimen by solving an optimization problem, using at least two SEM images acquired at different illumination angles

A method, a non-transitory computer readable medium and a system for determining three dimensional (3D) information of structural elements of a substrate.

Determining three dimensional information

A method that includes receiving first and second detection signals and electrocardiograph signals; wherein the first detection signals result from an illumination, by an oxygen saturation sensor included in a device that may be removably attached to a user, of a sternal angle of a user by infrared pulses; wherein the second detection signals result from an illumination, by the oxygen saturation sensor, of the sternal angle of a user by visible light pulses; wherein the electrocardiograph signals may be detected by an electrocardiography sensor that may be included in the device; generating a first waveform template that may be responsive to the first detection signals; generating a second waveform template that may be responsive to the second detection signals; calculating an indication of the oxygen saturation characteristic of the user in response to the first and second detection signals; detecting cardiac cycle durations that may be based upon the first and second detection signals; detecting electrocardiography based cardiac cycle durations; and evaluating a quality of the indication of the oxygen saturation characteristic of the user in response to the first waveform template, the second waveform template, the cardiac cycle's durations and the electrocardiography based cardiac cycle durations.

Positioning a medical device based on oxygen saturation measurements

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Rehovot, Israel

Anna Levant