Stmicroelectronics International N.v.

Stmicroelectronics Gmbh

Stmicroelectronics Pvt. Ltd.

St-ericsson Sa

Vj Intellia

Ankur Bal

Rupesh Singh

Anupam Jain

Sharad Gupta

Rakhel Kumar Parida

Neha Bhargava

Jeet Narayan Tiwari

Abhishek Jain

Vikram Singh

Namerita Khanna

Anil Kumar

Vivek Tripathi

Vikas Chelani

Mohit Singh

Pratap Narayan Singh

Chandrajit Debnath

Rakesh Malik

Parvesh Swami

Sri Ram Gupta

Manish Agarwal

Rajnish Garg

Rohit Kumar Gupta

Vineet Mehta

Shiva Sharath Babu Kaleru

Jitender Singh

Abhishek Kishore Kaul

An integrated circuit includes a plurality of ADC channels. During a calibration process of the ADC channels, the integrated circuit utilizes derivative filters to calculate a phase difference between the ADC channels. During a calibration process, the integrated circuit utilizes clock phase alignment circuits to align the phases of the ADC channels based on the outputs of the derivative filters.

Device and method for time skew calibration of multi channel ADC

Provided are a method and apparatus for controlling a skew between multiple data lanes. In the method and apparatus, a first data lane control stage controls control outputting first data over a first data lane based on a first data lane clock and a second data lane control stage controls outputting second data over a second data lane based on a second data lane clock. In the method and apparatus, a first device is associated with a system clock and is configured to generate the first and second data for outputting over the first and second data lanes. A clock control stage causes the first and second data lane clocks to be offset from each other by a fixed time duration that is an integer fraction of a cycle duration of the system clock.

Control of skew between multiple data lanes

An integrated circuit includes a continuous time delta sigma analog-to-digital converter (CTDS ADC) and a test circuit for testing the CTDS ADC. The test circuit converts multibit digital reference data to a single-bit digital stream. The test circuit then passes the single-bit digital stream to a finite impulse response digital-to-analog converter (FIR DAC). The FIR DAC converts the single-bit digital stream to an analog test signal. The analog test signal is then passed to the CTDS ADC. The CTDS ADC converts the analog test signal to digital test data. The test circuit analyzes the digital test data to determine the accuracy of the CTDS ADC.

On chip test architecture for continuous time delta sigma analog-to-digital converter

An integrated circuit includes a serializer configured to receive first test data in n-bit words and to generate a single bit data stream by serializing the test data in accordance with a first clock signal. The integrated circuit includes testing circuitry configured to test the serializer without utilizing a deserializer.

Low overhead loop back test for high speed transmitter

An N-bit linear feedback shift register includes P parallel chains of flip flops each having an input and output. The input is coupled to output of an XOR circuit for that parallel chain. Inputs of the XOR circuit for that parallel chain are coupled to outputs of different flip flops of the P parallel chains according to exponents of a primitive polynomial of order N−1. The flip flops of the P parallel chains of flip flops are clocked by a second clock. At each rising edge of the second clock, P LFSR pre-outputs are respectively produced from the outputs of last flip flops of each of P parallel chains of flip flops. Readout circuitry clocked by a first clock having a frequency that is P times that of the first clock passes a different one of the P pre-LFSR outputs at each clock cycle as a LFSR output.

High throughput linear feedback shift register

A serial-connection is tested by transmitting a PRBS generated using a kth-order monic-polynomial from transmission-circuitry to reception-circuitry, and determining operation is proper based upon the PRBS received. The PRBS is formed by generating x intermediate-words of the PRBS, x being a result of an integer-divide between a total number of bits in the PRBS and a bit-width of a serializer that transmits the PRBS, generating a leading-word of the PRBS as having first y-bits of the PRBS as its LSBs, y being based upon a modulo-divide between the total number of bits in the PRBS and x, and generating a trailing-word of the PRBS as having last z-bits of the PRBS as its MSBs, z being based upon a difference between a result of the modulo-divide and y. The PRBS is transmitted sequentially as the leading-word of the PRBS, the intermediate-words of the PRBS, and the trailing-word of the PRBS.

Method and architecture for serial link characterization by arbitrary size pattern generator

A device includes input data lines associated with a first time domain and output data lines associated with a second time domain. Synchronizing circuitry is coupled between the input data lines and output data lines. The synchronizing circuitry is driven by a synchronizing clock signal generated by clock generating circuitry. The clock generating circuitry is coupled to the input data lines and the synchronizing circuitry. In operation, the clock generating circuitry detects signal transitions on the plurality of input data lines. The clock generating circuitry generates the synchronizing clock signal that drives the synchronizing circuitry based on detected transitions, a clock signal of the first time domain, and a clock signal of the second time domain.

Device with low-power synchronizing circuitry and related method

An integrated circuit includes a first subsystem including a first clock generator configured to generate a first clock signal. The integrated circuit also includes a second subsystem including a second clock generator configured to generate a second clock signal. The first subsystem includes an edge detector configured to detect an edge of the second clock signal. The first clock generator generates the first clock signal with a selected phase relative to the second clock signal based on the edge of the second clock signal.

Low overhead mesochronous digital interface

Individual bits of a K bit unary data word, wherein K is greater than one, are applied to K polyphase finite impulse response filter circuits. Each polyphase finite impulse response filter circuit receives a different bit and operates with a single bit precision to generate from each received bit a filtered output data word. A gain adjustment is applied by a gain stage circuit to each filtered output data word to generate a corresponding gain adjusted output data word. The gain adjusted output data words from the gain stage circuits are summed to generate an output data word. The unary data word may be output from a source such as a data encoder or a quantizer.

High throughput digital filter architecture for processing unary coded data

A first multiplier multiplies a first input with a first coefficient and a first adder sums an output of the first multiplier and a second input to generate a first output. A second multiplier multiplies a third input with a second coefficient, a third multiplier multiplies a fourth input with a third coefficient, and a second adder sums outputs of the second and third multipliers to generate a second output. The second and third inputs are derived from the first output and the first and fourth inputs are derived from the second output. The first and second outputs generate digital values for first and second digital sinusoids, respectively.

High throughput parallel architecture for recursive sinusoid synthesizer

A continuous time, sigma-delta analog-to-digital converter circuit includes a sigma-delta modulator circuit configured to receive an analog input signal. A single bit quantizer of the modulator generates a digital output signal at a sampling frequency. A data storage circuit stores bits of the digital output signal and digital-to-analog converter (DAC) elements are actuated in response to the stored bits to generate an analog feedback signal for comparison to the analog input signal. A filter circuit includes polyphase signal processing paths and a summation circuit configured to sum outputs from the polyphase signal processing paths to generate a converted output signal. A fan out circuit selectively applies the stored bits from the data storage circuit to inputs of the polyphase signal processing paths of the filter circuit.

Sigma-delta analog-to-digital converter circuit with data sharing for power saving

An integrated circuit includes a plurality of flip-flops and a global reset network for resetting the flip-flops. The integrated circuit includes a synchronous clock delay circuit that delays, responsive to a global reset signal, a transition in a clock signal provided to the flip-flops. The delay in the transition of the clock signal ensures that all of the flip-flops receive the global reset signal within a same delayed clock cycle and that the flip-flops do not receive the global reset signal during a rising or falling edge of the clock signal.

Clock delay circuit for chip reset architecture

A time-interleaved analog to digital converter (TI-ADC) includes a first sub-ADC configured to sample and convert an input analog signal to generate a first digital signal and a second sub-ADC configured to sample and convert said input analog signal to generate a second digital signal. Sampling by the second sub-ADC occurs with a time skew mismatch. A multiplexor interleaves the first and second digital signals to generate a third digital signal. A time skew mismatch error determination circuit processes the first and second digital signals to generate a time error corresponding to the time skew mismatch. A slope value of said third digital signal is determined and multiplied by the time error to generate a signal error. The signal error is summed with the third digital signal to generate a digital output signal which eliminates the error due to the time skew mismatch. This correction is performed in real time.

Timing skew mismatch calibration for time interleaved analog to digital converters

An integrated circuit includes a first subsystem including a first clock generator configured to generate a first clock signal. The integrated circuit also includes a second subsystem including a second clock generator configured to generate a second clock signal. The first subsystem include a clock edge selector configured to determine a phase difference between the first clock signal and the second clock signal and to select, based on the phase difference, either a rising edge or a falling edge of the second clock signal to control output of data from the first subsystem to the second subsystem.

Data bridge for interfacing source synchronous datapaths with unknown clock phases

A data weighted averaging (DWA) data word in a standard or normal form unary code format is first converted to a thermometer control word in an alternative or spatial form unary code format. The thermometer control word is then converted from the alternative or spatial form unary code format to output a corresponding binary word.

Growing community of inventors

Greater Noida, India

Ankur Bal