Taiwan Semiconductor Manufacturing Comp. Ltd.

Ankita Patidar

Sandeep Kumar Goel

Yun-Han Lee

A semiconductor device includes an on-chip clock controller configured to provide a clock output signal and configured to receive a mode signal and a speed enable signal, and to generate a first fast clock enable signal and a first slow clock enable signal. The on-chip clock controller is configured to override the first fast clock enable signal based on the mode signal and the speed enable signal to provide a fast clock in the clock output signal and to override the first slow clock enable signal based on the mode signal and the speed enable signal to provide a slow clock in the clock output signal.

Circuit and methodology for power profile

A method of identifying cell-internal defects: obtaining a circuit design of an integrated circuit, the circuit design including netlists of one or more cells coupled to one another; identifying the netlist corresponding to one of the one or more cells; injecting a defect to one of a plurality of circuit elements and one or more interconnects of the cell; retrieving a first current waveform at a location of the cell where the defect is injected by applying excitations to inputs of the cell; retrieving, without the defect injected, a second current waveform at the location of the cell by applying the same excitations to the inputs of the cell; and selectively annotating, based on the first current waveform and the second current waveform, an input/output table of the cell with the defect.

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San Jose, CA, United States of America

Ankita Patidar