Siemens Healthcare Gmbh

Siemens Healthineers Ag

Anja Fritzler

Peter Geithner

Joerg Freudenberger

Thomas Weber

Christoph Jud

Marcus Radicke

Peter Hackenschmied

Steffen Kappler

Jörg Freudenberger

Petra Maurer

Ralf Nanke

Ludwig Ritschl

Michael Wimmer

Brigitte Streller

Ferdinand Lueck

Martin Petersilka

Josef Deuringer

Peter Roehrer

Dieter Matuszok

Lukas Havla

One or more example embodiments relates to a cathode device and an X-ray source. The cathode device for an X-ray source has an electron emitter including a plurality of field effect emitter elements aligned in parallel to form an emission surface on the upper side of the plurality of field effect emitter elements aligned in parallel a gate electrode, arranged above the emission surface, a multiple first contact elements for at least two independently current-carrying current paths of the electron emitter, electrons from at least one of the current paths are emittable depending on an emission voltage between the gate electrode and the emission surface via the field effect emitter elements; and an emitter seat including multiple second contact elements, the multiple second contact elements connectable with the multiple first contact elements for closing the current paths.

Cathode device with improved electron emitter contacting

A method for reducing electron emission of an electron emitter comprises: emitting electrons from a first current path via at least one first field effect emitter element, subject to an emission voltage between a gate electrode and an emission surface; determining a property of the first current path; and activating a first current limiting unit subject to the properties of the first current path to reduce the electron emission of the electron emitter.

Reducing an electron emission of an electron emitter

A method for controlling an FFS X-ray system comprises: simulating a beam geometry of the X-ray beam at a specified FFS deflection onto the detector during recording of a projection image; determining whether cross-radiation is present in a region around the detector by the simulated beam geometry of the X-ray beam; generating FFS control data for the recording of the projection image, wherein the FFS control data either (i) causes FFS deflection that is reduced relative to the specified FFS deflection for the recording of the projection image in the event of the cross-radiation being present for the recording of the projection image or (ii) causes the specified FFS deflection otherwise; repeating the simulating, the determining and the generating FFS control data for at least one further recording of a projection image; and generating a control data set including the FFS control data, for controlling an FFS X-ray system.

Method and system for controlling an FFS X-ray system

One or more example embodiments relates to an extra-focal beam aperture device for an X-ray emitter and to the X-ray emitter. The extra-focal beam aperture device according to one or more example embodiments for an X-ray emitter has a planar beam-shaping element including an X-ray opaque material, the planar beam-shaping element being configured to form a useful X-ray beam and an X-ray measuring beam separate from the useful X-ray beam, from an X-ray beam bundle incident upon the extra-focal beam aperture device, the planar beam-shaping element including two side faces opposite each other, a radial lateral surface between the two side faces, a cross-section through the radial lateral surface having an approximately trapezoid shape, and at least one cut-out for shaping the X-ray measuring beam, the at least one cut-out having a tapering cross-section.

Extra-focal beam aperture device for an x-ray emitter

One or more example embodiments relates to a method for calibrating an X-ray emitter having a cathode, an anode and a coil, wherein the coil is connected to a conductor arrangement through which an electrical function current is guided through the coil. The method comprises measuring an induction current that is induced in the coil at the conductor arrangement of the coil; calculating a compensation current for an effecting coil of the X-ray emitter based on the measured induction current, the effecting coil configured to change an electron beam between the cathode and the anode, wherein the compensation current is calculated such that a magnetic field that induces the induction current during the measuring is compensated using a magnetic field that is produced by the compensation current in the effecting coil; and applying the compensation current in the effecting coil.

Method and system for calibrating an X-ray emitter

At least one example embodiment provides an electron emitter apparatus having a first ring of field-effect emitter needles, the field-effect emitter needles of the first ring forming a first emitter surface on an inner side of the first ring; and a second ring of field-effect emitter needles, the field-effect emitter needles of the second ring forming a second emitter surface on an inner side of the second ring, wherein the first ring and the second ring are arranged in such that the first emitter surface and the second emitter surface form a substantially contiguous three-dimensional overall emitter surface, the substantially contiguous three-dimensional overall emitter surface defining a hollow channel along a longitudinal axis of the electron emitter apparatus.

Electron emitter apparatus

Some example embodiments provide an x-ray tube for a stereoscopic imaging having an evacuated x-ray tube housing; an electron emitter apparatus in the x-ray tube housing, the electron emitter apparatus including a first field effect emitter with a first emitter surface and a second field effect emitter with a second emitter surface, at least one of the first emitter surface or the second emitter surface being segmented such that a portion of the at least one of the first emitter surface or the second emitter surface can be set relative to the respective overall emitter surface by selectively switching emitter segments of the at least one of the first emitter surface or the second emitter surface; an anode unit in the x-ray tube housing, the anode unit configured to generate x-ray radiation for the stereoscopic imaging as a function of electrons striking two focal points; and a control unit.

X-ray tube for a stereoscopic imaging

An x-ray anode for an x-ray emitter has a structured surface provided for impingement with electrons. According to an embodiment of the invention, the structured surface has a surface structure which alternates periodically at least in sections and which varies in the micrometer range with respect to its depth extension and periodicity.

X-ray anode, x-ray emitter and method for producing an x-ray anode

An x-ray emitter includes an x-ray tube and an x-ray emitter housing. In an embodiment, the x-ray tube includes an evacuated x-ray tube housing, a cathode for emitting electrons and an anode for generating x-rays as a function of the electrons. Further, in an embodiment, the x-ray emitter housing includes the x-ray tube and outside of the x-ray tube, a gaseous cooling medium. In an embodiment, the x-ray emitter further includes a compressor for a forced convection of the gaseous cooling medium for cooling the x-ray tube, a pressure ratio between the intake side and pressure side of the compressor being greater than 1.3.

X-ray emitter

A method is for spatially influencing a focal spot of an X-ray source that generates X-ray radiation, to an associated X-ray source, to an associated system and to an associated computer program product. The method according to at least one embodiment includes: producing a focal spot on an anode by way of an electron emitter including a plurality of emitter segments, individually controllable to emit electrons; determining at least one actual value of a spatial extent and/or of a position of the produced focal spot; comparing the at least one actual value with a specified reference value of the focal spot; and controlling the emitter segments based upon the comparison of the at least one actual value and the reference value such that the at least one actual value converges toward the reference value, thereby spatially influencing the focal spot of the X-ray source that generates X-ray radiation.

Influencing a focal spot

An X-ray radiator and an X-ray assembly are disclosed. The X-ray radiator according to an embodiment has an evacuated X-ray tube housing, mounted to be rotatable about a rotation axis, the X-ray tube housing including an anode and an electron source. The anode is arranged within the X-ray tube housing non-rotatably relative to the X-ray tube housing and is configured to generate X-ray radiation via electrons impacting upon a focal spot of the anode, the electron source being mounted substantially stationary within the X-ray tube housing relative to the rotation axis. The electron source has a main emitter and at least one subsidiary emitter for emitting electrons. The electron emission of the main emitter and/or of the at least one subsidiary emitter is controllable such that a spatial movement of the focal spot due to a movement of the electron source is reduced.

X-ray radiator

An x-ray tube includes an electron emitter to emit an electron beam; and a multilayer anode including a first anode layer facing the electron beam and a second anode layer facing away from the electron beam. The first anode layer includes a first anode material to generate a braking radiation via the electron beam and the second anode layer includes a second anode material to generate a further x-ray radiation via the braking radiation. The further x-ray radiation is relatively more monochromatic than the braking radiation and wherein the first anode layer and the second anode layer adjoin in a planar manner.

X-ray tube

An x-ray imaging system includes an x-ray source configured to emit x-ray radiation towards a sample, and a primary detector configured to detect x-ray radiation from the x-ray source passing through the sample. The x-ray imaging system also includes a secondary detector configured to detect x-ray radiation from the x-ray source scattered in the sample, and imaging optics configured to guide x-ray radiation scattered in the sample onto the secondary detector.

X-ray imaging system and method of x-ray imaging

A method, in an embodiment, is for setting an X-ray intensity using a structured anode or a field emitter cathode or a finger-shaped cathode head. Other embodiments include an associated X-ray device, an associated single X-ray tube CT scanner, an associated dual X-ray tube CT scanner, and an associated computer program product.

Growing community of inventors

Erlangen, Germany

Anja Fritzler