International Business Machines Corporation

Animesh Khare

Narendra Keshav Rane

Vikram Iyengar

Umesh Kumar Shukla

Kenneth Pichamuthu

Ravi Lakshmipathy

Santoshkumar Jinagar

Pradeep K Vanama

Aspects of the invention provide for reducing power consumption during manufacturing testing of an IC. In one embodiment, aspects of the invention include a method for reducing power consumption during a manufacturing test of an integrated circuit (IC), the method including: providing a plurality of domains, each domain associated with a clock phase; grouping, based on each domain, a first plurality of scan chains into a first test group; grouping, based on each domain, a second plurality of scan chains into a second test group, wherein the grouping of the first test group and of the second test group includes determining which domains can be tested simultaneously; and performing the manufacturing test of the IC.

Reducing power consumption during manufacturing test of an integrated circuit

A clock-data recovery doubler circuit for digitally encoded communications signals is provided. A window comparator includes two thresholds. A clock output is created by the window comparator and also used internally as feedback. Based on the clock output, the window comparator circuit collapses the thresholds while sampling input Bipolar return to zero data.

Structure for window comparator circuit for clock data recovery from bipolar RZ data

A method and system for testing a synthesized design of a semiconductor chip. The method includes inputting a macro test Input/Output (I/O) name of the semiconductor chip, along with associated attributes and a netlist, where the netlist is a synthesized design of the semiconductor chip. The method includes tracking the macro test I/O to a chip test I/O. The method further includes detecting mismatches between attributes associated with the macro test I/O and the chip test I/O. Subsequently, reporting any mismatches between the attributes associated with the macro test I/O and the chip test I/O.

Automated isolation of logic and macro blocks in chip design testing

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Bengaluru, India

Animesh Khare