Advanced Micro Devices Corporation

Ati Technologies Ulc

Animesh Jain

Arun Sundaresan Iyer

Girish Anathahalli Singrigowda

Jagadeesh Anathahalli Singrigowda

Dhruvin Devangbhai Shah

Prateek Mishra

Bhawna Tomar

Shibashish Patel

Nagendra Chandrakar

Sonia Ghosh

Aditya Mitra

Thanapandi Ganesan

Thanapandi G

Krishna Sethupathy Leela

A voltage level-shifting circuit for an integrated circuit includes an input terminal receiving a voltage signal referenced to an input/output (I/O) voltage level. A transistor overvoltage protection circuit includes a first p-type metal oxide semiconductor (PMOS) transistor includes a source coupled to the second voltage supply, a gate receiving an enable signal, and a drain connected to a central node. A first n-type metal oxide semiconductor (NMOS) transistor includes a drain connected to the central node, a gate connected to the input terminal, and a source connected to an output terminal. A second NMOS transistor includes a drain connected to the input terminal, a gate connected to the central node, and a source connected to the output terminal.

High to low level shifter architecture using lower voltage devices

A level shifting output circuit converts a signal from a core voltage to an I/O voltage without causing voltage overstress on transistor terminals in the level shifting output circuit. The output circuit includes protection transistors to protect various transistors in the output circuit from overvoltage conditions including those transistors coupled to I/O power supply nodes.

Level shifting output circuit

A reference voltage generation circuit for use with current mode logic includes a first transistor of a first conductivity type configured to operate as a diode-connected resistor with a source terminal coupled to a first voltage supply terminal for conducting a supply voltage and a gate terminal coupled to a drain terminal. Second and third transistors of a second conductivity type are coupled in series between the drain terminal of the first transistor and a second voltage supply terminal. Gate terminals of the second and third transistors coupled to the gate terminal of the first transistor. A reference voltage is obtained between the second and third transistors. The first and second NMOS transistors are sized such that they remain in sub-threshold mode operation during operation with an expected range of the supply voltage. Current mode logic circuits are also provided using the reference voltage generation circuit.

Reference voltage generation for current mode logic

Embodiments of systems and methods are described for reducing the effects of hysteresis in the operation of data processing circuitry. In this embodiment of the invention, adaptive control circuitry is used to reduce the effects of hysteresis. The embodiment disclosed herein provides significant reduction in the effects of hysteresis and, therefore, a significant reduction in the amount of guard band needed to compensate for hysteresis effects in SOI processes and thereby improving the performance/power characteristics of the circuit.

Supplying hysteresis effect mitigated clock signals based on silicon-test characterized parameter

Embodiments of systems and methods for improved first-in-first-out (FIFO), last-in-last out (LIFO) and full-cycle decoders are described herein. In the various embodiments of the system, a clock generator is operable to generate a clock signal having an active phase and an inactive phase. A set of monotonic flip-flops are operable to capture a set of incoming data addresses during the active cycle of the clock and to generate therefrom data corresponding to single bits in the addresses that have changed compared to the data addresses received by the set of monotonic flip-flops during an immediately preceding data capture cycle. A set of static flip-flops are operable to capture a set of incoming data addresses during the inactive phase of the clock cycle and to generate set output data therefrom. A decoder operable to process the set output data from the set of static flip-flops and to generate a set of old wordlines corresponding to a set of data addresses in the immediately preceding data capture cycle. Combinational is logic operable to receive the set of single changed bits and the set of old wordlines and to generate therefrom a set of new wordlines. Methods are also described herein for using the aforementioned system.

Fast cyclic decoder circuit for FIFO/LIFO data buffer

A pulsed latch circuit with conditional shutoff prevents an input node, such as a node receiving data, of the pulsed latch circuit, from latching data based on a delayed input control signal, such as an internal clocking signal, and based on a feedback latch state transition detection signal indicating that a current state of input data is stored in the latch. As such, two control conditions are used to shut down the latch. In one example, a condition generator detects when the latch has captured data correctly and outputs a signal to disable the input node. In addition, a variable delay circuit is used to adjust the width of the allowable input signal to set a worst case shutoff time. If data is latched early, a feedback latch state transition detection signal causes the input node to be disabled. If data is not latched early, the maximum allowable latch time is set by the variable delay circuit.

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Bengaluru, India

Animesh Jain