Commissariat a L'energie Atomique

Angelo Guiga

Franck Vial

Philippe Peltie

Francedillaois Marion

Michelle Boitel

Christian Lucas

Gilbert Gaude

The inventive optical device for measuring the thickness of a medium which is at least partially transparent for an incident beam and covers a second medium comprises a laser for generating the light incident beam in such a way that a beam reflected by the first medium surface and a beam scattered by the second medium surface are formed. The device comprises a photosensitive linear array for detecting the reflected beam and the scattered beam and a processing circuit which is connected to the linear array and enables to measure a space between the reflected beam and the scattered beam and to determine the thickness of the first medium according to the measured space. The processing circuit determines a distance between the linear array and the surface of the second medium from the position of at least one beam and corrects the valve of the thickness of the first medium according to the distance.

Optical device for measuring the thickness of an at least partially transparent medium

Electromagnetic radiation detector and its production process. The detector comprises a thin detection material film (8), which is sensitive to the radiation to be detected and which has a first and a second faces (10, 12), the first face being directly exposed to the radiation to be detected, a resin coating (18) surrounding the thin detection material film (8) and having a lip (20) which projects beyond the first face (10) of the thin film (8).

Electromagnetic radiation detector and its production process

Automatic device for measuring the noise level of electronic components. This device comprises selection means (20) to which are connected the components and which are able to select one of these components, measuring means (28) able to determine the noise of the selected component, said measuring means incorporating means (32,34) for biasing the selected component and for processing signals supplied by the thus biased selected component and also incorporating analysis means (36) determining the noise from signals supplied by the processing means, as well as means (10) for controlling the selection means (20) and measuring means (28), said control means (10) being electrically decoupled from the selection means (20) and the biasing and processing means (32,24). Application to the sorting of electronic components following their manufacture.

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Tullins, France

Angelo Guiga