Fifth Electronics Research Institute of Ministry of Industry and Information Technology

Ang Li

Yiqiang Chen

Yunfei En

Bo Hou

Dengyun Lei

Wenxiao Fang

Lichao Hao

An ESD failure early warning circuit for an integrated circuit is disclosed, including a positive voltage stress generation module, a negative voltage stress generation module, a buck module, a warning output module, capacitors C, C, and diodes D, D, D, Dand D. The ESD failure early warning circuit can report a warning timely when there is an ESD event in the monitored integrated circuit, to improve the reliability of the device effectively. Moreover, the stress voltage generated by the positive voltage stress generation module and the negative voltage stress generation module is adjustable, so the stress voltage can be set flexibly by a user according to actual condition of the monitored integrated circuit. The present invention has high flexibility and wide application prospect.

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Guangzhou, China

Ang Li